Miniaturized objective lens for a photoelectron emission microscope

2000 ◽  
Author(s):  
Laurence Singleton ◽  
Yannick Ansel ◽  
Ralf Baron ◽  
Gebhard H. Marx ◽  
Matthias Nienhaus ◽  
...  
Keyword(s):  
Objective Lens ◽  
Photoelectron Emission ◽  
Photoelectron Emission Microscope

Investigation of ultra-thin Ag films on Ni with the photoelectron emission microscope

1985 ◽  
Vol 17 (1) ◽  
pp. 21-30 ◽  
Author(s):  
H. Bethge ◽  
Th. Krajewski ◽  
O. Lichtenberger
Keyword(s):  
Photoelectron Emission ◽  
Photoelectron Emission Microscope

Development of a Synchrotron Radiation Photoelectron Emission Microscope(SR-PEEM) for Magnetic Imaging.

2001 ◽  
Vol 25 (4−2) ◽  
pp. 1059-1062 ◽  
Author(s):  
T. Kihara ◽  
K. Ono ◽  
T. Okuda ◽  
A. Harasawa ◽  
M. Oshima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Photoelectron Emission ◽  
Magnetic Imaging ◽  
Photoelectron Emission Microscope

SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter

1998 ◽  
Vol 05 (06) ◽  
pp. 1249-1256 ◽  
Author(s):  
R. Wichtendahl ◽  
R. Fink ◽  
H. Kuhlenbeck ◽  
D. Preikszas ◽  
H. Rose ◽  
...  
Keyword(s):  
Lateral Resolution ◽  
High Spectral Resolution ◽  
Objective Lens ◽  
Photoelectron Emission ◽  
X Ray ◽  
Small Spot ◽  
Back Ground ◽  
Chromatic Aberrations ◽  
Low Energy Electron ◽  
Under Construction

A new UHV spectroscopic X-ray photoelectron emission and low energy electron microscope is presently under construction for the installation at the PM-6 soft X-ray undulator beamline at BESSY II. Using a combination of a sophisticated magnetic beam splitter and an electrostatic tetrode mirror, the spherical and chromatic aberrations of the objective lens are corrected and thus the lateral resolution and sensitivity of the instrument improved. In addition a corrected imaging energy filter (a so-called omega filter) allows high spectral resolution (ΔE=0.1 eV ) in the photoemission modes and back-ground suppression in LEEM and small-spot LEED modes. The theoretical prediction for the lateral resolution is 5 Å; a realistic goal is about 2 nm. Thus, a variety of electron spectroscopies (XAS, XPS, UPS, XAES) and electron diffraction (LEED, LEEM) or reflection techniques (MEM) will be available with spatial resolution unreached so far.

A new sample holder for laser-excited pump-probe magnetic measurements on a Focus photoelectron emission microscope

2008 ◽  
Vol 79 (3) ◽  
pp. 033702 ◽  
Author(s):  
Jorge Miguel ◽  
Matthias Bernien ◽  
Daniela Bayer ◽  
Jaime Sánchez-Barriga ◽  
Florian Kronast ◽  
...  
Keyword(s):  
Magnetic Measurements ◽  
Sample Holder ◽  
Photoelectron Emission ◽  
Pump Probe ◽  
Photoelectron Emission Microscope

A UHV-compatible photoelectron emission microscope for applications in surface science

1991 ◽  
Vol 36 (1-3) ◽  
pp. 148-153 ◽  
Author(s):  
W. Engel ◽  
M.E. Kordesch ◽  
H.H. Rotermund ◽  
S. Kubala ◽  
A. von Oertzen
Keyword(s):  
Surface Science ◽  
Photoelectron Emission ◽  
Photoelectron Emission Microscope
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