scholarly journals Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

2008 ◽  
Vol 79 (3) ◽  
pp. 033704 ◽  
Author(s):  
Boris J. Albers ◽  
Marcus Liebmann ◽  
Todd C. Schwendemann ◽  
Mehmet Z. Baykara ◽  
Markus Heyde ◽  
...  
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Specific Force ◽  
Site Specific ◽  
Atomic Force ◽  
Resolution Imaging ◽  
Temperature Scanning

Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes

1999 ◽  
Vol 5 (3) ◽  
pp. 208-215 ◽  
Author(s):  
Masashi Iwatsuki ◽  
Kazuyuki Suzuki ◽  
Shin-ich Kitamura ◽  
Mike Kersker
Keyword(s):  
Detection Method ◽  
Variable Temperature ◽  
Contact Potential Difference ◽  
Oscillation Amplitude ◽  
Ultrahigh Vacuum ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Contact Potential ◽  
Atomic Force ◽  
Temperature Scanning

With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 × 7 structures and Si(100) 2 × 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.

scholarly journals Atomic Resolution with the Atomic Force Microscope

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Atomic Force Microscope ◽  
Recent Article ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope

1999 ◽  
Vol 140 (3-4) ◽  
pp. 243-246 ◽  
Author(s):  
S Orisaka ◽  
T Minobe ◽  
T Uchihashi ◽  
Y Sugawara ◽  
S Morita
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force ◽  
Resolution Imaging

Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)

1995 ◽  
Vol 34 (Part 2, No. 4A) ◽  
pp. L462-L464 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Masahiro Ohta ◽  
Hitoshi Ueyama ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Resolution ◽  
Atomic Force ◽  
Resolution Imaging
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