Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy

2003 ◽  
Vol 67 (8) ◽  
Author(s):  
R. Hoffmann ◽  
M. A. Lantz ◽  
H. J. Hug ◽  
P. J. A. van Schendel ◽  
P. Kappenberger ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Force Microscopy ◽  
Atomic Resolution ◽  
Distance Measurements ◽  
Force Microscopy ◽  
Scanning Force ◽  
Resolution Imaging ◽  
Temperature Scanning

Low Temperature Scanning Force Microscopy

1995 ◽  
pp. 35-62 ◽  
Author(s):  
H. J. Hug ◽  
A. Moser ◽  
O. Fritz ◽  
B. Stiefel ◽  
I. Parashikov
Keyword(s):  
Low Temperature ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Temperature Scanning

Low Temperature Scanning Force Microscopy of theSi(111)−(7×7)Surface

2000 ◽  
Vol 84 (12) ◽  
pp. 2642-2645 ◽  
Author(s):  
M. A. Lantz ◽  
H. J. Hug ◽  
P. J. A. van Schendel ◽  
R. Hoffmann ◽  
S. Martin ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Temperature Scanning

scholarly journals Molecular-resolution imaging of pentacene on KCl(001)

2012 ◽  
Vol 3 ◽  
pp. 186-191 ◽  
Author(s):  
Julia L Neff ◽  
Jan Götzen ◽  
Enhui Li ◽  
Michael Marz ◽  
Regina Hoffmann-Vogel
Keyword(s):  
High Resolution ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Molecular Arrangement ◽  
Domain Boundaries ◽  
Different Types ◽  
Scanning Force ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Dynamic Scanning

The growth of pentacene on KCl(001) at submonolayer coverage was studied by dynamic scanning force microscopy. At coverages below one monolayer pentacene was found to arrange in islands with an upright configuration. The molecular arrangement was resolved in high-resolution images. In these images two different types of patterns were observed, which switch repeatedly. In addition, defects were found, such as a molecular vacancy and domain boundaries.

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