High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
2003 ◽
Vol 74
(8)
◽
pp. 3656-3663
◽
2008 ◽
Vol 79
(3)
◽
pp. 033704
◽
1993 ◽
Vol 51
◽
pp. 704-705
1991 ◽
Vol 9
(2)
◽
pp. 1129
◽
1993 ◽
Vol 32
(Part 1, No. 6B)
◽
pp. 2983-2988
◽
1996 ◽
Vol 35
(Part 1, No. 6B)
◽
pp. 3767-3771
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