A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

2014 ◽  
Vol 85 (2) ◽  
pp. 023706 ◽  
Author(s):  
Wolfram Steurer ◽  
Leo Gross ◽  
Reto R. Schlittler ◽  
Gerhard Meyer
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Variable Temperature ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Temperature Scanning

Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3750-3752 ◽  
Author(s):  
Katsuyuki Suzuki ◽  
Masashi Iwatsuki ◽  
Shin-ichi Kitamura ◽  
Charles B. Mooney
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Ultrahigh Vacuum ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Atomic Force

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

A variable-temperature scanning tunneling microscope operated in a continuous flow cryostat

2019 ◽  
Vol 90 (9) ◽  
pp. 093702 ◽  
Author(s):  
Jihao Wang ◽  
Yubin Hou ◽  
Tao Geng ◽  
Jing Zhang ◽  
Qiyuan Feng ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Continuous Flow ◽  
Variable Temperature ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Temperature Scanning

A scanner for an ultrahigh-vacuum low-temperature scanning tunneling microscope

2007 ◽  
Vol 50 (3) ◽  
pp. 422-423
Author(s):  
B. A. Loginov ◽  
K. N. El’tsov ◽  
S. V. Zaitsev-Zotov ◽  
A. N. Klimov ◽  
V. M. Shevlyuga
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscope ◽  
Ultrahigh Vacuum ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Temperature Scanning

scholarly journals A compact low temperature scanning tunneling microscope

2009 ◽  
Vol 150 (1) ◽  
pp. 012007
Author(s):  
Anjan Kumar Gupta ◽  
Jaivardhan Sinha ◽  
Shyam Kumar Choudhary ◽  
Udai Raj Singh
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Temperature Scanning
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