Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers

2006 ◽  
Vol 77 (2) ◽  
pp. 023705 ◽  
Author(s):  
Ichiro Shiraki ◽  
Yutaka Miyatake ◽  
Toshihiko Nagamura ◽  
Kazushi Miki
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force ◽  
Piezoresistive Cantilevers

Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

2011 ◽  
Vol 82 (2) ◽  
pp. 023705 ◽  
Author(s):  
U. Gysin ◽  
S. Rast ◽  
M. Kisiel ◽  
C. Werle ◽  
E. Meyer
Keyword(s):  
Low Temperature ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Force

Atomic Resolution with Atomic Force Microscope

1993 ◽  
pp. 213-218
Author(s):  
G. Binnig ◽  
Ch Gerber ◽  
E. Stoll ◽  
T. R. Albrecht ◽  
C. F. Quate
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

Phase modulation atomic force microscope with true atomic resolution

2006 ◽  
Vol 77 (12) ◽  
pp. 123703 ◽  
Author(s):  
Takeshi Fukuma ◽  
Jason I. Kilpatrick ◽  
Suzanne P. Jarvis
Keyword(s):  
Atomic Force Microscope ◽  
Phase Modulation ◽  
Atomic Resolution ◽  
Atomic Force

Atomic resolution with atomic force microscope

1987 ◽  
Vol 189-190 ◽  
pp. 1-6 ◽  
Author(s):  
G. Binnig ◽  
Ch. Gerber ◽  
E. Stoll ◽  
T.R. Albrecht ◽  
C.F. Quate
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document