Composition Profile of MOVPE Grown InP/InGaAs/InP Quantum Well Structures Studied by Cross-Sectional Scanning Tunneling Microscopy

2007 ◽  
Author(s):  
I. Yamakawa ◽  
Y. Akanuma ◽  
W. S. Lee ◽  
T. Ujihara ◽  
Y. Takeda ◽  
...  
Keyword(s):  
Quantum Well ◽  
Scanning Tunneling Microscopy ◽  
Composition Profile ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional ◽  
Quantum Well Structures

InGaAs/InP quantum well intermixing studied by cross-sectional scanning tunneling microscopy

2001 ◽  
Vol 89 (9) ◽  
pp. 4815-4823 ◽  
Author(s):  
Huajie Chen ◽  
H. A. McKay ◽  
R. M. Feenstra ◽  
G. C. Aers ◽  
P. J. Poole ◽  
...  
Keyword(s):  
Quantum Well ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Quantum Well Intermixing ◽  
Cross Sectional

Cross-sectional scanning tunneling microscopy of biased semiconductor lasers

2007 ◽  
Vol 102 (2) ◽  
pp. 024306 ◽  
Author(s):  
R. J. Cobley ◽  
K. S. Teng ◽  
M. R. Brown ◽  
S. P. Wilks
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Semiconductor Lasers ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional
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