InGaAs/InP quantum well intermixing studied by cross-sectional scanning tunneling microscopy

Huajie Chen; H. A. McKay; R. M. Feenstra; G. C. Aers; P. J. Poole; R. L. Williams; S. Charbonneau; P. G. Piva; T. W. Simpson; I. V. Mitchell

doi:10.1063/1.1361237

InGaAs/InP quantum well intermixing studied by cross-sectional scanning tunneling microscopy

Journal of Applied Physics ◽

10.1063/1.1361237 ◽

2001 ◽

Vol 89 (9) ◽

pp. 4815-4823 ◽

Cited By ~ 29

Author(s):

Huajie Chen ◽

H. A. McKay ◽

R. M. Feenstra ◽

G. C. Aers ◽

P. J. Poole ◽

...

Keyword(s):

Quantum Well ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Quantum Well Intermixing ◽

Cross Sectional

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Composition Profile of MOVPE Grown InP/InGaAs/InP Quantum Well Structures Studied by Cross-Sectional Scanning Tunneling Microscopy

10.1063/1.2729798 ◽

2007 ◽

Author(s):

I. Yamakawa ◽

Y. Akanuma ◽

W. S. Lee ◽

T. Ujihara ◽

Y. Takeda ◽

...

Keyword(s):

Quantum Well ◽

Scanning Tunneling Microscopy ◽

Composition Profile ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional ◽

Quantum Well Structures

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Cross-Sectional Scanning Tunneling Microscopy Study of Interfacial Roughness in an InGaAs/InP Multiple Quantum Well Structure Grown by Metalorganic Vapor Phase Epitaxy

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.1548 ◽

2003 ◽

Vol 42 (Part 1, No. 4A) ◽

pp. 1548-1551 ◽

Cited By ~ 7

Author(s):

Ichirou Yamakawa ◽

Takeshi Yamauchi ◽

Ryo Oga ◽

Yasufumi Fujiwara ◽

Yoshikazu Takeda ◽

...

Keyword(s):

Quantum Well ◽

Scanning Tunneling Microscopy ◽

Vapor Phase ◽

Multiple Quantum Well ◽

Microscopy Study ◽

Scanning Tunneling ◽

Multiple Quantum ◽

Tunneling Microscopy ◽

Cross Sectional ◽

Scanning Tunneling Microscopy Study

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Composition Profile of ZnSe/BeTe Multiple Quantum Well Structures Studied by Cross-Sectional Scanning Tunneling Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.l1337 ◽

2005 ◽

Vol 44 (No. 43) ◽

pp. L1337-L1340 ◽

Cited By ~ 3

Author(s):

Ichirou Yamakawa ◽

Yasuhiko Akanuma ◽

Bing Sheng Li ◽

Ryoichi Akimoto ◽

Arao Nakamura

Keyword(s):

Quantum Well ◽

Scanning Tunneling Microscopy ◽

Multiple Quantum Well ◽

Composition Profile ◽

Scanning Tunneling ◽

Multiple Quantum ◽

Tunneling Microscopy ◽

Cross Sectional ◽

Quantum Well Structures

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Cross-sectional scanning tunneling microscopy of GaAsSb/GaAs quantum well structures

Journal of Applied Physics ◽

10.1063/1.1501740 ◽

2002 ◽

Vol 92 (7) ◽

pp. 3761-3770 ◽

Cited By ~ 13

Author(s):

S. L. Zuo ◽

Y. G. Hong ◽

E. T. Yu ◽

J. F. Klem

Keyword(s):

Quantum Well ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional ◽

Quantum Well Structures

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Incorporation of Bi atoms in InP studied at the atomic scale by cross-sectional scanning tunneling microscopy

Physical Review Materials ◽

10.1103/physrevmaterials.1.034606 ◽

2017 ◽

Vol 1 (3) ◽

Cited By ~ 7

Author(s):

C. M. Krammel ◽

M. Roy ◽

F. J. Tilley ◽

P. A. Maksym ◽

L. Y. Zhang ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Atomic Scale ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional

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Comparative study of cross-sectional scanning tunneling microscopy/spectroscopy on III–V hetero- and homostructures: Ultrahigh vacuum-cleaved versus sulfide passivated

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587218 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2610 ◽

Cited By ~ 13

Author(s):

A. R. Smith

Keyword(s):

Comparative Study ◽

Scanning Tunneling Microscopy ◽

Ultrahigh Vacuum ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional

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Atomic-Scale View of Epitaxial Layers with Cross-Sectional Scanning Tunneling Microscopy

Semiconductor Interfaces at the Sub-Nanometer Scale ◽

10.1007/978-94-011-2034-0_22 ◽

1993 ◽

pp. 207-216

Author(s):

M. B. Johnson ◽

U. Maier ◽

H. P. Meier ◽

H. Salemink ◽

E. T. Yu ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Atomic Scale ◽

Scanning Tunneling ◽

Epitaxial Layers ◽

Tunneling Microscopy ◽

Cross Sectional

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Cross-Sectional Scanning Tunneling Microscopy of GaAs Doping Superlattices: Pinned vs. Unpinned Surfaces

Semiconductor Interfaces at the Sub-Nanometer Scale ◽

10.1007/978-94-011-2034-0_14 ◽

1993 ◽

pp. 127-137 ◽

Cited By ~ 2

Author(s):

R. M. Feenstra ◽

A. Vaterlaus ◽

E. T. Yu ◽

P. D. Kirchner ◽

C. L. Lin ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional

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Cross-sectional scanning tunneling microscopy of biased semiconductor lasers

Journal of Applied Physics ◽

10.1063/1.2757006 ◽

2007 ◽

Vol 102 (2) ◽

pp. 024306 ◽

Cited By ~ 3

Author(s):

R. J. Cobley ◽

K. S. Teng ◽

M. R. Brown ◽

S. P. Wilks

Keyword(s):

Scanning Tunneling Microscopy ◽

Semiconductor Lasers ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional

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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy

Journal of Applied Physics ◽

10.1063/1.3380826 ◽

2010 ◽

Vol 107 (9) ◽

pp. 094507 ◽

Cited By ~ 1

Author(s):

R. J. Cobley ◽

P. Rees ◽

K. S. Teng ◽

S. P. Wilks

Keyword(s):

Surface Modification ◽

Scanning Tunneling Microscopy ◽

Semiconductor Laser ◽

Real Time ◽

Laser Diodes ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Cross Sectional ◽

Semiconductor Laser Diodes

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