Tunneling current at the interface of silicon and silicon dioxide partly embedded with silicon nanocrystals in metal oxide semiconductor structures
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2001 ◽
Vol 119
(2)
◽
pp. 67-71
◽
2017 ◽
Vol 78
◽
pp. 227-232
◽
2000 ◽
Vol 39
(Part 1, No. 2A)
◽
pp. 424-431
◽
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