Silicon layer transfer by hydrogen implantation combined with wafer bonding in ultrahigh vacuum

2006 ◽  
Vol 89 (19) ◽  
pp. 192109 ◽  
Author(s):  
Alin Mihai Fecioru ◽  
Stephan Senz ◽  
Roland Scholz ◽  
Ulrich Gösele
1999 ◽  
Vol 574 ◽  
Author(s):  
M. Alexe ◽  
P. Kopperschmidt ◽  
U. Gösele ◽  
Qin-Yi Tong ◽  
Li-Juan Huang

AbstractThe present paper proposes a simple method which may be able to provide true single-crystal films of complex oxides on large substrates including semiconductors like silicon or gallium arsenide. The method describes a layer transfer process using layer splitting by hydrogen implantation and direct wafer bonding (DWB) to obtain single-crystal oxide films on different substrates. Alternatively, a fabrication process of ferroelectric-semiconductor heterostructures based on direct wafer bonding and layer transfer is also described. This process is an alternative method to the direct deposition of oxides films (ferroelectric, high-k) on silicon and allows fabrication of metal oxide-silicon heterostructures with an interface having a good structural quality as well as a low trap density.


2013 ◽  
Author(s):  
U. Dadwal ◽  
S. Chandra ◽  
P. Kumar ◽  
D. Kanjilal ◽  
R. Singh

2019 ◽  
Vol 16 (8) ◽  
pp. 385-391
Author(s):  
Diefeng Gu ◽  
H. Baumgart ◽  
Konstantin Bourdelle ◽  
George K. Celler ◽  
Abdelmageed Elmustafa

2010 ◽  
Vol 39 (10) ◽  
pp. 2233-2236 ◽  
Author(s):  
Ki Yeol Byun ◽  
Isabelle Ferain ◽  
Scott Song ◽  
Susan Holl ◽  
Cindy Colinge

2001 ◽  
Vol 30 (7) ◽  
pp. 841-844 ◽  
Author(s):  
Cynthia Colinge ◽  
Brian Roberds ◽  
Brian Doyle

2007 ◽  
Vol 253 (7) ◽  
pp. 3595-3599 ◽  
Author(s):  
R. Singh ◽  
I. Radu ◽  
M. Reiche ◽  
C. Himcinschi ◽  
B. Kuck ◽  
...  

1996 ◽  
Vol 446 ◽  
Author(s):  
A.J. Auberton‐Hervé ◽  
T. Barge ◽  
F. Metral ◽  
M. Bruel ◽  
B. Aspar ◽  
...  

AbstractThe advantage of SOI wafers for device manufacture has been widely studied. To be a real challenger to bulk silicon, SOI producers have to offer SOI wafers in large volume and at low cost. The new Smart‐Cut® SOI process used for the manufacture of the Unibond® SOI wafers answers most of the SOI wafer manufacturability issues. The use of Hydrogen implantation and wafer bonding technology is the best combination to get good uniformity and high quality for both the SOI and buried oxide layer. In this paper, the Smart‐Cut® process is described in detail and material characteristics of Unibond® wafers such as crystalline quality, surface roughness, thin film thickness homogeneity, and electric behavior.


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