Phase modulation atomic force microscope with true atomic resolution

2006 ◽  
Vol 77 (12) ◽  
pp. 123703 ◽  
Author(s):  
Takeshi Fukuma ◽  
Jason I. Kilpatrick ◽  
Suzanne P. Jarvis
Keyword(s):  
Atomic Force Microscope ◽  
Phase Modulation ◽  
Atomic Resolution ◽  
Atomic Force

Atomic Resolution with Atomic Force Microscope

1993 ◽  
pp. 213-218
Author(s):  
G. Binnig ◽  
Ch Gerber ◽  
E. Stoll ◽  
T. R. Albrecht ◽  
C. F. Quate
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force

Atomic resolution with atomic force microscope

1987 ◽  
Vol 189-190 ◽  
pp. 1-6 ◽  
Author(s):  
G. Binnig ◽  
Ch. Gerber ◽  
E. Stoll ◽  
T.R. Albrecht ◽  
C.F. Quate
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force

scholarly journals Atomic Resolution with the Atomic Force Microscope

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Atomic Force Microscope ◽  
Recent Article ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

scholarly journals Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation

1993 ◽  
Author(s):  
Constant A. Putman ◽  
Kees O. van der Werf ◽  
Bart G. de Grooth ◽  
Niko F. van Hulst ◽  
Jan Greve
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Friction Measurement ◽  
Atomic Force

Development of In-Situ Surface Observation System with an Atomic Resolution under Tensile Stress by Atomic Force Microscope

2002 ◽  
Vol 750 ◽  
Author(s):  
Akihito Matsumuro ◽  
Kimiharu Kayukawa ◽  
Youhei Fujimoto ◽  
Taeko Ando ◽  
Kazuo Sato
Keyword(s):  
Tensile Stress ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Atomic Resolution ◽  
Observation System ◽  
Testing System ◽  
Surface Observation ◽  
Atomic Force ◽  
On Chip

ABSTRACTA new in-situ surface observation system under tensile stress with an atomic resolution has been developed for the purpose of the explanation of the deformation of the surface and the crack growth mechanism for thin films in the micro- and nano-mechanical systems. The mechanical properties such as Young's modulus can be determined at the same time. This observation system consists of the on-chip tensile testing system and a commercialized atomic force microscope (AFM). The on-chip testing system is characterized by a static loading mechanism with a flat spring and a test chip of single-crystal silicon of 15×15×0.5 mm. Particular attention has been paid to the suppression of the vibration which effects on images of the surface with an atomic resolution. Atomic images of the surface of mica can be observed under various tensile strains till the occurrence of the fracture. The growth of the cracks and Young's modulus for TiN thin film deposited on silicon (100) specimen can be also clarified.

The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope

1999 ◽  
Vol 140 (3-4) ◽  
pp. 243-246 ◽  
Author(s):  
S Orisaka ◽  
T Minobe ◽  
T Uchihashi ◽  
Y Sugawara ◽  
S Morita
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Resolution ◽  
Atomic Force ◽  
Resolution Imaging

Atomic-Resolution Electrochemistry with the Atomic Force Microscope: Copper Deposition on Gold

Science ◽  
1991 ◽  
Vol 251 (4990) ◽  
pp. 183-186 ◽  
Author(s):  
S. MANNE ◽  
P. K. HANSMA ◽  
J. MASSIE ◽  
V. B. ELINGS ◽  
A. A. GEWIRTH
Keyword(s):  
Atomic Force Microscope ◽  
Copper Deposition ◽  
Atomic Resolution ◽  
Atomic Force
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