Force spectroscopy based on temperature controlled atomic force microscope head using piezoresistive cantilevers
2005 ◽
Vol 76
(4)
◽
pp. 043701
◽
Keyword(s):
Keyword(s):
1999 ◽
Vol 70
(11)
◽
pp. 4300-4303
◽
2003 ◽
Vol 74
(8)
◽
pp. 3656-3663
◽
2001 ◽
pp. 37-61
◽