Extraction of strained-Si metal-oxide-semiconductor field-effect transistor parameters using small signal channel conductance method
1994 ◽
Vol 33
(Part 1, No. 4B)
◽
pp. 2412-2414
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Keyword(s):
Keyword(s):
Keyword(s):
1969 ◽
Vol 116
(5)
◽
pp. 699
◽
2005 ◽
Vol 44
(No. 51)
◽
pp. L1560-L1562
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