scholarly journals Low-Frequency Current Fluctuations in Post-Hard Breakdown Thin Silicon Oxide Films

2005 ◽  
Author(s):  
Yasuhisa Omura
Keyword(s):  
Silicon Oxide ◽  
Oxide Films ◽  
Low Frequency ◽  
Current Fluctuations ◽  
Thin Silicon ◽  
Frequency Current

scholarly journals Unique features of the generation–recombination noise in quasi-one-dimensional van der Waals nanoribbons

Nanoscale ◽  
2018 ◽  
Vol 10 (42) ◽  
pp. 19749-19756 ◽  
Author(s):  
Adane K. Geremew ◽  
Sergey Rumyantsev ◽  
Matthew A. Bloodgood ◽  
Tina T. Salguero ◽  
Alexander A. Balandin
Keyword(s):  
Carrying Capacity ◽  
Van Der Waals ◽  
Low Frequency ◽  
Current Fluctuations ◽  
Electronic Noise ◽  
High Current ◽  
One Dimensional ◽  
Frequency Current

We describe the low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional ZrTe3 van der Waals nanoribbons, which have recently attracted attention owing to their extraordinary high current carrying capacity.

Low‐level leakage currents in thin silicon oxide films

1994 ◽  
Vol 76 (1) ◽  
pp. 319-327 ◽  
Author(s):  
D. J. Dumin ◽  
J. R. Cooper ◽  
J. R. Maddux ◽  
R. S. Scott ◽  
D.‐P. Wong
Keyword(s):  
Silicon Oxide ◽  
Oxide Films ◽  
Leakage Currents ◽  
Low Level ◽  
Thin Silicon

scholarly journals Introducing pinhole magnification by selective etching: application to poly-Si on ultra-thin silicon oxide films

2017 ◽  
Vol 124 ◽  
pp. 435-440 ◽  
Author(s):  
Dominic Tetzlaff ◽  
Marvin Dzinnik ◽  
Jan Krügener ◽  
Yevgeniya Larionova ◽  
Sina Reiter ◽  
...  
Keyword(s):  
Silicon Oxide ◽  
Oxide Films ◽  
Selective Etching ◽  
Thin Silicon

scholarly journals Low-frequency current fluctuations in doped ladders

2001 ◽  
Vol 65 (2) ◽  
Author(s):  
Kenji Tsutsui ◽  
Didier Poilblanc ◽  
Sylvain Capponi
Keyword(s):  
Low Frequency ◽  
Current Fluctuations ◽  
Frequency Current

Formation of thin silicon oxide films by rapid thermal heating

1986 ◽  
Vol 59 (11) ◽  
pp. 3921-3923 ◽  
Author(s):  
J. P. Ponpon ◽  
J. J. Grob ◽  
A. Grob ◽  
R. Stuck
Keyword(s):  
Silicon Oxide ◽  
Oxide Films ◽  
Thermal Heating ◽  
Thin Silicon

Growth mechanism of thin silicon oxide films on Si(100) studied by medium-energy ion scattering

1995 ◽  
Vol 52 (3) ◽  
pp. 1759-1775 ◽  
Author(s):  
E. P. Gusev ◽  
H. C. Lu ◽  
T. Gustafsson ◽  
E. Garfunkel
Keyword(s):  
Growth Mechanism ◽  
Silicon Oxide ◽  
Oxide Films ◽  
Medium Energy ◽  
Ion Scattering ◽  
Thin Silicon ◽  
Medium Energy Ion Scattering
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