Spin on dopants for high-performance single-crystal silicon transistors on flexible plastic substrates

2005 ◽  
Vol 86 (13) ◽  
pp. 133507 ◽  
Author(s):  
Z.-T. Zhu ◽  
E. Menard ◽  
K. Hurley ◽  
R. G. Nuzzo ◽  
J. A. Rogers
2014 ◽  
Author(s):  
Xiaochuan Xu ◽  
Harish Subbaraman ◽  
Swapnajit Chakravarty ◽  
Ray T. Chen

1989 ◽  
Vol 28 (22) ◽  
pp. 4748 ◽  
Author(s):  
Keyvan Sayyah ◽  
Murray S. Welkowsky ◽  
Philip G. Reif ◽  
Norman W. Goodwin

2006 ◽  
Vol 27 (6) ◽  
pp. 460-462 ◽  
Author(s):  
Jong-Hyun Ahn ◽  
Hoon-Sik Kim ◽  
Keon Jae Lee ◽  
Zhengtao Zhu ◽  
E. Menard ◽  
...  

1982 ◽  
Vol 3 (12) ◽  
pp. 369-372 ◽  
Author(s):  
N.M. Johnson ◽  
D.K. Biegelsen ◽  
H.C. Tuan ◽  
M.D. Moyer ◽  
L.E. Fennell

1981 ◽  
Vol 5 ◽  
Author(s):  
Rajiv R. Shah ◽  
D. Randy Hollingsworth ◽  
D. Lloyd Crosthwait

ABSTRACTWe demonstrate, for the first time, a technique for the fabrication of polysilicon resistors with excellent control and temperature characteristics: a standard deviation of 2.5 Ω/□ and temperature variation of -5.6% from 25° to 125°C for 1.96kΩ/□, 4.5 × 1014 cm˗2 boron implanted polysilicon resistors. The technique is based on fabricating resistors in laser recrystallized polysilicon on SiO2. Resistor performance is compared to that of similar resistors fabricated in standard LPCVD polysilicon and in single crystal silicon.


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