Aluminum, oxide, and silicon phonons by inelastic electron tunneling spectroscopy on metal-oxide-semiconductor tunnel junctions: Accurate determination and effect of electrical stress
2004 ◽
Vol 43
(11A)
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pp. 7472-7476
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2009 ◽
Vol 113
(9)
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pp. 3874-3880
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1978 ◽
Vol 1
(4)
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pp. 479-502
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