Localization of gate oxide integrity defects in silicon metal-oxide-semiconductor structures with lock-in IR thermography
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Lock In
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1997 ◽
Vol 36
(Part 1, No. 5A)
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pp. 2565-2570
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1998 ◽
Vol 27
(4)
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pp. L21-L25
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1999 ◽
Vol 3
(6)
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pp. 290
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1989 ◽
Vol 20
(6)
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pp. 27-39
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