Localization of gate oxide integrity defects in silicon metal-oxide-semiconductor structures with lock-in IR thermography

2000 ◽  
Vol 88 (7) ◽  
pp. 4000 ◽  
Author(s):  
S. Huth ◽  
O. Breitenstein ◽  
A. Huber ◽  
U. Lambert
1997 ◽  
Vol 36 (Part 1, No. 5A) ◽  
pp. 2565-2570 ◽  
Author(s):  
Hirofumi Shimizu ◽  
Yuji Sugino ◽  
Norio Suzuki ◽  
Shogo Kiyota ◽  
Koichi Nagasawa ◽  
...  

1998 ◽  
Vol 27 (4) ◽  
pp. L21-L25 ◽  
Author(s):  
H. S. Kim ◽  
D. H. Ko ◽  
D. L. Bae ◽  
N. I. Lee ◽  
D. W. Kim ◽  
...  

2002 ◽  
Vol 80 (14) ◽  
pp. 2514-2516 ◽  
Author(s):  
Dae-Gyu Park ◽  
Kwan-Yong Lim ◽  
Heung-Jae Cho ◽  
Tae-Ho Cha ◽  
In-Seok Yeo ◽  
...  

1989 ◽  
Vol 20 (6) ◽  
pp. 27-39 ◽  
Author(s):  
J. Suñé ◽  
I. Placencia ◽  
E. Farrés ◽  
N. Barniol ◽  
F. Martin ◽  
...  

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