Quantitative inelastic tunneling spectroscopy in the silicon metal-oxide-semiconductor system

1997 ◽  
Vol 71 (17) ◽  
pp. 2523-2525 ◽  
Author(s):  
Whye-Kei Lye ◽  
Eiji Hasegawa ◽  
Tso-Ping Ma ◽  
Richard C. Barker ◽  
Yin Hu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Tunneling Spectroscopy ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor System ◽  
Inelastic Tunneling

scholarly journals Tunneling spectroscopy of metal-oxide-semiconductor field-effect transistor at low temperature

2005 ◽  
Vol 86 (24) ◽  
pp. 242104
Author(s):  
Mingqiang Bao ◽  
Fei Liu ◽  
Filipp Baron ◽  
Kang L. Wang ◽  
Ruigang Li
Keyword(s):  
Low Temperature ◽  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Tunneling Spectroscopy ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Effect Transistor
Sign in / Sign up

Export Citation Format

Share Document