Effects of hydrogen surface pretreatment of silicon dioxide on the nucleation and surface roughness of polycrystalline silicon films prepared by rapid thermal chemical vapor deposition

1996 ◽  
Vol 69 (4) ◽  
pp. 485-487 ◽  
Author(s):  
Y. Z. Hu ◽  
C. Y. Zhao ◽  
C. Basa ◽  
W. X. Gao ◽  
E. A. Irene
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