High‐resolution imaging using near‐field scanning optical microscopy and shear force feedback in water

1996 ◽  
Vol 68 (24) ◽  
pp. 3380-3382 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan B. Kämmer
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Shear Force ◽  
Force Feedback ◽  
Near Field ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Surface photoelectrochemistry using near-field scanning optical microscopy (NSOM)

1996 ◽  
Vol 54 ◽  
pp. 858-859
Author(s):  
Patrick J. Moyer
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Shear Force ◽  
Force Feedback ◽  
Near Field ◽  
Feedback Mechanism ◽  
Frequency Spectra ◽  
Water Resonance ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) has been used to characterize and modify surfaces with lateral spatial resolution as high as 50 nm. Some of these experiments were performed under electrochemical conditions. Progress towards this goal involved several important steps. They include proving adequate operation of the shear force feedback mechanism in liquids and fabrication of appropriate NSOM fiber probes.With regards to shear force feedback, which is used to maintain the fiber probe within the near field of the sample, there has been ample discussion regarding the physics of the tip-sample interaction. It is important for biological and photoelectrochemical applications that the feedback mechanism operates successfully in liquid environments. Our results indicate that shear force operation in water allows for high spatial resolution NSOM characterization while providing high force sensitivity. When comparing the frequency spectra of the probe resonances in air and water, the water resonance is broadened. The broadened resonance peak when completely immersing the probe in water indicates an increase in damping.

scholarly journals Near-Field Scanning Optical Microscopy for High-Resolution Membrane Studies

Nanoimaging ◽  
2012 ◽  
pp. 373-394 ◽  
Author(s):  
Heath A. Huckabay ◽  
Kevin P. Armendariz ◽  
William H. Newhart ◽  
Sarah M. Wildgen ◽  
Robert C. Dunn
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-Field Scanning Optical Microscopy Studies of Materials and Devices

MRS Bulletin ◽  
1997 ◽  
Vol 22 (8) ◽  
pp. 27-30 ◽  
Author(s):  
J.W.P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Light Source ◽  
Optical Fibers ◽  
Force Feedback ◽  
Near Field ◽  
Single Mode ◽  
Field Zone ◽  
Research Activities ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) provides a means to study optical and optoelectronic properties of materials at the nanometer scale. The key to achieving resolution higher than the diffraction limit is to place a subwavelength-sized light source—e.g., an aperture—within the near-field zone of the sample. In this case, the area of the sample illuminated is determined by the aperture size and not by the wavelength (see Figure 1). An image can then be formed by moving the sample and light source with respect to each other. While the principle of near-field optics is straightforward, its realization at visible-light wavelengths was not achieved until the invention of scanning-probe techniques in the 1980s. Since Betzig et al. demonstrated in 1991 that bright subwavelength apertures can be made by tapering and metal-coating single-mode optical fibers, research activities involving NSOM have increased tremendously. The later incorporation of shear-force feedback to regulate tip-sample separation adds another strength to NSOM. Using this distance regulation, a topographic image similar to that obtained by a conventional scanning force microscope is acquired simultaneously with the optical image. This provides a way to correlate structural and physical properties at the same sample positions and greatly simplifies interpretation of the NSOM data.

Combined shear force and near‐field scanning optical microscopy

1992 ◽  
Vol 60 (20) ◽  
pp. 2484-2486 ◽  
Author(s):  
E. Betzig ◽  
P. L. Finn ◽  
J. S. Weiner
Keyword(s):  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Super-resolution imaging with near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 25 (2) ◽  
pp. 155-163 ◽  
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
A. Lewis ◽  
K. Lin
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Super Resolution ◽  
Resolution Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy

2001 ◽  
Vol 72 (11) ◽  
pp. 4178-4182 ◽  
Author(s):  
A. Simon ◽  
R. Brunner ◽  
J. O. White ◽  
O. Hollricher ◽  
O. Marti
Keyword(s):  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Distance Control ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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