Shear force microscopy with capacitance detection for near‐field scanning optical microscopy
1996 ◽
Vol 98
(7)
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pp. 661-664
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Keyword(s):
2002 ◽
Vol 205
(2)
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pp. 136-146
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2002 ◽
Vol 73
(8)
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pp. 2942-2947
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2000 ◽
Vol 104
(51)
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pp. 12098-12101
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Keyword(s):
Keyword(s):
1999 ◽
Vol 146
(5)
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pp. 239-243
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