Shear force microscopy with capacitance detection for near‐field scanning optical microscopy

1995 ◽  
Vol 66 (11) ◽  
pp. 1432-1434 ◽  
Author(s):  
J‐K. Leong ◽  
C. C. Williams
2000 ◽  
Vol 104 (51) ◽  
pp. 12098-12101 ◽  
Author(s):  
Christine M. R. Clancy ◽  
Jeffrey R. Krogmeier ◽  
Anna Pawlak ◽  
Malgorzata Rozanowska ◽  
Tadeusz Sarna ◽  
...  

1992 ◽  
Vol 60 (20) ◽  
pp. 2484-2486 ◽  
Author(s):  
E. Betzig ◽  
P. L. Finn ◽  
J. S. Weiner

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