Combined shear force and near‐field scanning optical microscopy

1992 ◽  
Vol 60 (20) ◽  
pp. 2484-2486 ◽  
Author(s):  
E. Betzig ◽  
P. L. Finn ◽  
J. S. Weiner
Keyword(s):  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Surface photoelectrochemistry using near-field scanning optical microscopy (NSOM)

1996 ◽  
Vol 54 ◽  
pp. 858-859
Author(s):  
Patrick J. Moyer
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Shear Force ◽  
Force Feedback ◽  
Near Field ◽  
Feedback Mechanism ◽  
Frequency Spectra ◽  
Water Resonance ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) has been used to characterize and modify surfaces with lateral spatial resolution as high as 50 nm. Some of these experiments were performed under electrochemical conditions. Progress towards this goal involved several important steps. They include proving adequate operation of the shear force feedback mechanism in liquids and fabrication of appropriate NSOM fiber probes.With regards to shear force feedback, which is used to maintain the fiber probe within the near field of the sample, there has been ample discussion regarding the physics of the tip-sample interaction. It is important for biological and photoelectrochemical applications that the feedback mechanism operates successfully in liquid environments. Our results indicate that shear force operation in water allows for high spatial resolution NSOM characterization while providing high force sensitivity. When comparing the frequency spectra of the probe resonances in air and water, the water resonance is broadened. The broadened resonance peak when completely immersing the probe in water indicates an increase in damping.

Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy

2001 ◽  
Vol 72 (11) ◽  
pp. 4178-4182 ◽  
Author(s):  
A. Simon ◽  
R. Brunner ◽  
J. O. White ◽  
O. Hollricher ◽  
O. Marti
Keyword(s):  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Distance Control ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

A novel digital feedback scheme of shear-force control in near-field scanning optical microscopy

1997 ◽  
Vol 68 (7) ◽  
pp. 2783-2786 ◽  
Author(s):  
Ki Hyun Kim ◽  
Sang-Kee Eah ◽  
Byoungho Lee ◽  
Chang Ho Cho ◽  
Wonho Jhe
Keyword(s):  
Optical Microscopy ◽  
Force Control ◽  
Shear Force ◽  
Near Field ◽  
Feedback Scheme ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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