scholarly journals Erratum: Direct imaging of dopants in GaAs with cross‐sectional scanning tunneling microscopy [Appl. Phys. Lett. 63, 2923 (1993)]

1994 ◽  
Vol 64 (11) ◽  
pp. 1454-1454 ◽  
Author(s):  
M. B. Johnson ◽  
O. Albrektsen ◽  
R. M. Feenstra ◽  
H. W. Salemink
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Direct Imaging ◽  
Cross Sectional

Direct imaging of dopants in GaAs with cross‐sectional scanning tunneling microscopy

1993 ◽  
Vol 63 (21) ◽  
pp. 2923-2925 ◽  
Author(s):  
M. B. Johnson ◽  
O. Albrektsen ◽  
R. M. Feenstra ◽  
H. W. M. Salemink
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Direct Imaging ◽  
Cross Sectional

Direct Imaging Using Scanning Tunneling Microscopy of the Atomic Structure in Amorphous Co1-xPx

1992 ◽  
pp. 348-355
Author(s):  
J. M. Gonzalez ◽  
F. Cebollada ◽  
M. Vazquez ◽  
M. Aguilar ◽  
M. Pancorbo ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Structure ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Direct Imaging

Cross-sectional scanning tunneling microscopy of biased semiconductor lasers

2007 ◽  
Vol 102 (2) ◽  
pp. 024306 ◽  
Author(s):  
R. J. Cobley ◽  
K. S. Teng ◽  
M. R. Brown ◽  
S. P. Wilks
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Semiconductor Lasers ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Cross Sectional

Direct imaging of Au and Ag clusters by scanning tunneling microscopy

1986 ◽  
Vol 49 (14) ◽  
pp. 853-855 ◽  
Author(s):  
David W. Abraham ◽  
Klaus Sattler ◽  
Eric Ganz ◽  
H. Jonathon Mamin ◽  
Ruth Ellen Thomson ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Direct Imaging ◽  
Ag Clusters
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