Optical detection of misfit dislocation‐induced deep levels at InGaAs/GaAs heterojunctions

1994 ◽  
Vol 64 (26) ◽  
pp. 3572-3574 ◽  
Author(s):  
A. Raisanen ◽  
L. J. Brillson ◽  
R. S. Goldman ◽  
K. L. Kavanagh ◽  
H. H. Wieder
Author(s):  
K.P.D. Lagerlöf ◽  
A.H. Heuer ◽  
T.E. Mitchell

It has been reported by Lally et. al. [1] that precipitates of hematite (Fe2O3, space group R3c) in a matrix of ilmenite (FeTiO3, space group R3) are lens shaped and flattened along the [0001]-direction. The coherency across the interface is lost by the introduction of a misfit dislocation network, which minimizes the strain due to the deviation in lattice parameters between the two phases [2]. The purpose of this paper is to present a new analysis of this network.


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1447-C8-1448
Author(s):  
T. Tsuboi ◽  
R. Laiho
Keyword(s):  

Author(s):  
Nataliya Mitina ◽  
Vladimir Krylov

The results of an experiment to determine the activation energy of a deep level in a gallium arsenide mesastructure, obtained by the method of capacitive deep levels transient spectroscopy with data processing according to the Oreshkin model and Lang model, are considered.


Author(s):  
Aleksey Bogachev ◽  
Vladimir Krylov

The results of an experiment to determine the activation energy of a deep level in a gallium arsenide mesastructure by capacitive relaxation spectroscopy of deep levels at various values of the blocking voltage are considered.


2020 ◽  
Vol 13 (11) ◽  
pp. 112007
Author(s):  
Joel Edouard Nkeck ◽  
Xavier Ropagnol ◽  
Riad Nechache ◽  
François Blanchard

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