Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy

1993 ◽  
Vol 62 (7) ◽  
pp. 786-788 ◽  
Author(s):  
M. P. Murrell ◽  
M. E. Welland ◽  
S. J. O’Shea ◽  
T. M. H. Wong ◽  
J. R. Barnes ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Measurements ◽  
Gate Oxides ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force

Characterization of silicon gate oxides by conducting atomic force microscopy

2002 ◽  
Vol 33 (2) ◽  
pp. 168-172 ◽  
Author(s):  
S. Kremmer ◽  
C. Teichert ◽  
E. Pischler ◽  
H. Gold ◽  
F. Kuchar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Gate Oxides ◽  
Force Microscopy ◽  
Atomic Force

Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy

2003 ◽  
Vol 102 (1-3) ◽  
pp. 88-93 ◽  
Author(s):  
S. Kremmer ◽  
S. Peissl ◽  
C. Teichert ◽  
F. Kuchar ◽  
H. Hofer
Keyword(s):  
Atomic Force Microscopy ◽  
Gate Oxides ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Silicon

Spatially resolved organic coating on clay minerals in bitumen froth revealed by atomic force microscopy adhesion mapping

Fuel ◽  
2017 ◽  
Vol 191 ◽  
pp. 283-289 ◽  
Author(s):  
Qiang Chen ◽  
Jun Liu ◽  
Thomas Thundat ◽  
Murray R. Gray ◽  
Qi Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Clay Minerals ◽  
Organic Coating ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document