Nanoscale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces: a novel operational mode in atomic force microscopy

2002 ◽  
Author(s):  
Gregory S. Watson ◽  
Bradley P. Dinte ◽  
Jolanta A. Blach ◽  
Sverre Myhra
Keyword(s):  
Atomic Force Microscopy ◽  
Simultaneous Measurement ◽  
Operational Mode ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force ◽  
Out Of Plane ◽  
Force Components

Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy

1993 ◽  
Vol 62 (7) ◽  
pp. 786-788 ◽  
Author(s):  
M. P. Murrell ◽  
M. E. Welland ◽  
S. J. O’Shea ◽  
T. M. H. Wong ◽  
J. R. Barnes ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Measurements ◽  
Gate Oxides ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force

scholarly journals Interpreting motion and force for narrow-band intermodulation atomic force microscopy

2013 ◽  
Vol 4 ◽  
pp. 45-56 ◽  
Author(s):  
Daniel Platz ◽  
Daniel Forchheimer ◽  
Erik A Tholén ◽  
David B Haviland
Keyword(s):  
Atomic Force Microscopy ◽  
Narrow Band ◽  
Frequency Comb ◽  
Oscillation Amplitude ◽  
Surface Force ◽  
Amplitude Dependence ◽  
Band Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Components

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (F I ) and quadrature to the motion (F Q ). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that F I and F Q actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of F I and F Q from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components F I and F Q , providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.

Spatially resolved organic coating on clay minerals in bitumen froth revealed by atomic force microscopy adhesion mapping

Fuel ◽  
2017 ◽  
Vol 191 ◽  
pp. 283-289 ◽  
Author(s):  
Qiang Chen ◽  
Jun Liu ◽  
Thomas Thundat ◽  
Murray R. Gray ◽  
Qi Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Clay Minerals ◽  
Organic Coating ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force
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