Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy

2003 ◽  
Vol 76 (1) ◽  
pp. 63-69 ◽  
Author(s):  
S. Myhra
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force

Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy

1993 ◽  
Vol 62 (7) ◽  
pp. 786-788 ◽  
Author(s):  
M. P. Murrell ◽  
M. E. Welland ◽  
S. J. O’Shea ◽  
T. M. H. Wong ◽  
J. R. Barnes ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Measurements ◽  
Gate Oxides ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force

Spatially resolved organic coating on clay minerals in bitumen froth revealed by atomic force microscopy adhesion mapping

Fuel ◽  
2017 ◽  
Vol 191 ◽  
pp. 283-289 ◽  
Author(s):  
Qiang Chen ◽  
Jun Liu ◽  
Thomas Thundat ◽  
Murray R. Gray ◽  
Qi Liu
Keyword(s):  
Atomic Force Microscopy ◽  
Clay Minerals ◽  
Organic Coating ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force

Spatially resolved dopant profiling of patterned Si wafers by bias-applied phase-imaging tapping-mode atomic force microscopy

1999 ◽  
Vol 74 (10) ◽  
pp. 1421-1423 ◽  
Author(s):  
M. W. Nelson ◽  
P. G. Schroeder ◽  
R. Schlaf ◽  
B. A. Parkinson ◽  
C. W. Almgren ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Imaging ◽  
Tapping Mode ◽  
Dopant Profiling ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy

Nano Letters ◽  
2017 ◽  
Vol 17 (7) ◽  
pp. 4489-4496 ◽  
Author(s):  
Aaron Mascaro ◽  
Zi Wang ◽  
Pierre Hovington ◽  
Yoichi Miyahara ◽  
Andrea Paolella ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lithium Battery ◽  
Ionic Transport ◽  
Force Microscopy ◽  
Spatially Resolved ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document