Modelling interconnects for future VLSI circuit applications

2019 ◽  
pp. 125-150
Keyword(s):  
Vlsi Circuit

Automatic Registering and Stitching of TEM/STEM Image Mosaics

2013 ◽  
Author(s):  
Chung-Ching Lin ◽  
Franco Stellari ◽  
Lynne Gignac ◽  
Peilin Song ◽  
John Bruley
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Vlsi Circuit ◽  
Significant Progress ◽  
Research Areas ◽  
Automated Method ◽  
Transmission Electron ◽  
Stem Image ◽  
High Resolution Images ◽  
Global Optimal

Abstract Transmission Electron Microscopy (TEM) and scanning TEM (STEM) is widely used to acquire ultra high resolution images in different research areas. For some applications, a single TEM/STEM image does not provide enough information for analysis. One example in VLSI circuit failure analysis is the tracking of long interconnection. The capability of creating a large map of high resolution images may enable significant progress in some tasks. However, stitching TEM/STEM images in semiconductor applications is difficult and existing tools are unable to provide usable stitching results for analysis. In this paper, a novel fully automated method for stitching TEM/STEM image mosaics is proposed. The proposed method allows one to reach a global optimal configuration of each image tile so that both missing and false-positive correspondences can be tolerated. The experiment results presented in this paper show that the proposed method is robust and performs well in very challenging situations.

Sensitivity-based CMOS VLSI circuit performance optimisation

1995 ◽  
Vol 31 (22) ◽  
pp. 1918-1919
Author(s):  
P.J. Mather ◽  
P. Hallam ◽  
M. Brouwer
Keyword(s):  
Vlsi Circuit ◽  
Circuit Performance ◽  
Cmos Vlsi
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