Reconstruction of a functional test sequence for increased fault coverage

2017 ◽  
Vol 11 (3) ◽  
pp. 91-99
Author(s):  
Irith Pomeranz
Keyword(s):  
Fault Coverage ◽  
Functional Test ◽  
Test Sequence

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test

2014 ◽  
Vol 30 (3) ◽  
pp. 317-328 ◽  
Author(s):  
M. de Carvalho ◽  
P. Bernardi ◽  
E. Sanchez ◽  
M. Sonza Reorda ◽  
O. Ballan
Keyword(s):  
Fault Coverage ◽  
Functional Test ◽  
Operational Phase

scholarly journals Adaptive random testing with total cartesian distance for black box circuit under test

2020 ◽  
Vol 20 (2) ◽  
pp. 720
Author(s):  
Arbab Alamgir ◽  
Abu Khari A’ain ◽  
Norlina Paraman ◽  
Usman Ullah Sheikh
Keyword(s):  
Computational Complexity ◽  
Test Pattern ◽  
Fault Coverage ◽  
Black Box ◽  
Test Sequence ◽  
Random Testing ◽  
Subsequent Test ◽  
Adaptive Random Testing ◽  
Candidate Set ◽  
Circuit Under Test

<p>Testing and verification of digital circuits is of vital importance in electronics industry. Moreover, key designs require preservation of their intellectual property that might restrict access to the internal structure of circuit under test. Random testing is a classical solution to black box testing as it generates test patterns without using the structural implementation of the circuit under test. However, random testing ignores the importance of previously applied test patterns while generating subsequent test patterns. An improvement to random testing is Antirandom that diversifies every subsequent test pattern in the test sequence. Whereas, computational intensive process of distance calculation restricts its scalability for large input circuit under test. Fixed sized candidate set adaptive random testing uses predetermined number of patterns for distance calculations to avoid computational complexity. A combination of max-min distance with previously executed patterns is carried out for each test pattern candidate. However, the reduction in computational complexity reduces the effectiveness of test set in terms of fault coverage. This paper uses a total cartesian distance based approach on fixed sized candidate set to enhance diversity in test sequence. The proposed approach has a two way effect on the test pattern generation as it lowers the computational intensity along with enhancement in the fault coverage. Fault simulation results on ISCAS’85 and ISCAS’89 benchmark circuits show that fault coverage of the proposed method increases up to 20.22% compared to previous method.</p>

Sequential Test Set Compaction in LFSR Reseeding

2011 ◽  
pp. 476-493
Author(s):  
Artur Jutman ◽  
Igor Aleksejev ◽  
Jaan Raik
Keyword(s):  
Optimization Technique ◽  
Fault Coverage ◽  
Sequential Test ◽  
Test Sequence ◽  
Great Similarity ◽  
Sequential Designs ◽  
Pseudorandom Sequences ◽  
Test Set ◽  
Embedded Test ◽  
Test Compaction

This chapter further details the topic of embedded self-test directing the reader towards the aspects of embedded test generation and test sequence optimization. The authors will brief the basics of widely used pseudorandom test generators and consider different techniques targeting the optimization of fault coverage characteristics of generated sequences. The authors will make the main focus on one optimization technique that is applicable to reseeding-based test generators and that uses a test compaction methodology. The technique exploits a great similarity in the way the faults are covered by pseudorandom sequences and by patterns generated for sequential designs. Hence, the test compaction methodology previously developed for the latter problem can be successfully reused in embedded testing.

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