Estimating the Fault Coverage of Functional Test Sequences Without Fault Simulation

2007 ◽  
Author(s):  
Irith Pomeranz ◽  
Praveen K. Parvathala ◽  
Srinivas Patil
Keyword(s):  
Fault Simulation ◽  
Fault Coverage ◽  
Functional Test

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test

2014 ◽  
Vol 30 (3) ◽  
pp. 317-328 ◽  
Author(s):  
M. de Carvalho ◽  
P. Bernardi ◽  
E. Sanchez ◽  
M. Sonza Reorda ◽  
O. Ballan
Keyword(s):  
Fault Coverage ◽  
Functional Test ◽  
Operational Phase

scholarly journals Test

2021 ◽  
pp. 381-391
Author(s):  
Peter Marwedel
Keyword(s):  
Physical System ◽  
Fault Tolerant ◽  
Fault Injection ◽  
Fault Simulation ◽  
Fault Coverage ◽  
Fault Model ◽  
Pattern Generation ◽  
Signature Analysis ◽  
Fault Tolerant Systems ◽  
Random Patterns

AbstractUnfortunately, we cannot rely on designed and possibly already manufactured systems to operate as expected. These systems may have become defective during their use, or their function may have been compromised during the fabrication or their design. The purpose of testing is to verify whether or not an existing embedded/cyber-physical system can be operated as expected. In this chapter, we will present fundamental terms and techniques for testing. There will be a brief introduction to the aims of test pattern generation and their application. We will be introducing terms such as fault model, fault coverage, fault simulation, and fault injection. Also, we will be presenting techniques which improve testability, including the generation of pseudo-random patterns, and signature analysis. It would be beneficial to consider testability issues already during design. In case of fault-tolerant systems, resilience must be verified.

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