Testing linear macros in mixed-signal systems using transient response testing and dynamic supply current monitoring

1994 ◽  
Vol 30 (15) ◽  
pp. 1216-1217 ◽  
Author(s):  
R.J. Binns ◽  
T.I. Pritchard ◽  
D. Taylor
VLSI Design ◽  
1997 ◽  
Vol 5 (3) ◽  
pp. 223-240
Author(s):  
Mahmoud A. Al-Qutayri ◽  
Peter R. Shepherd

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.


Author(s):  
K.R. Eckersall ◽  
P.L. Wrighton ◽  
I.M. Bell ◽  
B.R. Bannister ◽  
G.E. Taylor

2013 ◽  
Vol 61 (3) ◽  
pp. 691-696 ◽  
Author(s):  
R. Suszynski ◽  
K. Wawryn

Abstract A rapid prototyping method for designing mixed signal systems has been presented in the paper. The method is based on implementation of the field programmable analog array (FPAA) to configure and reconfigure mixed signal systems. A serial algorithmic analog digital converter has been used as an example. Three converter architectures have been selected and implemented FPAA device. To verify and illustrate converters operation and prototyping capabilities, implemented converters have been excited by a sinusoidal signal. Analog sinusoidal excitations, digital responses and sinusoidal waveforms after reconstruction are presented.


2012 ◽  
Vol 1 (1) ◽  
pp. 1-7
Author(s):  
Vadim Geurkov ◽  
◽  
Lev Kirischian ◽  
Keyword(s):  

Integration ◽  
1998 ◽  
Vol 26 (1-2) ◽  
pp. 141-150
Author(s):  
Vishwani D Agrawal
Keyword(s):  

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