A new technique for measuring lateral distribution of oxide charge and interface traps near MOSFET junctions

1991 ◽  
Vol 12 (7) ◽  
pp. 393-395 ◽  
Author(s):  
W. Chen ◽  
T.-P. Ma
Keyword(s):  
Lateral Distribution ◽  
New Technique ◽  
Interface Traps ◽  
Oxide Charge ◽  
A New Technique

A new technique to quantify deuterium passivation of interface traps in MOS devices

2001 ◽  
Vol 22 (5) ◽  
pp. 203-205 ◽  
Author(s):  
K. Cheng ◽  
K. Hess ◽  
J.W. Lyding
Keyword(s):  
New Technique ◽  
Interface Traps ◽  
Mos Devices ◽  
A New Technique

A new technique for the mapping of oxygen tension on the brain surface

2005 ◽  
Vol 25 (1_suppl) ◽  
pp. S543-S543
Author(s):  
Satoshi Kimura ◽  
Keigo Matsumoto ◽  
Yoshio Imahori ◽  
Katsuyoshi Mineura ◽  
Toshiyuki Itoh
Keyword(s):  
Oxygen Tension ◽  
New Technique ◽  
Brain Surface ◽  
A New Technique ◽  
The Brain

A new technique to visualize alveolar dynamics in a rabbit model

2009 ◽  
Vol 56 (S 01) ◽  
Author(s):  
J Bickenbach ◽  
R Rossaint ◽  
R Autschbach ◽  
R Dembinski
Keyword(s):  
Rabbit Model ◽  
New Technique ◽  
A New Technique
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