Growth mechanisms of Pd nanofilms electrodeposited onto Au(111): an in situ grazing incidence X-ray diffraction study

2016 ◽  
Vol 18 (4) ◽  
pp. 2830-2839 ◽  
Author(s):  
Yvonne Soldo-Olivier ◽  
Maurizio De Santis ◽  
Wang Liang ◽  
Eric Sibert

Surface X-ray diffraction characterization of a Pd10ML/Au(111) film. A characteristic Pd rod with sharp Bragg-like peaks is observed, signature of 3D islands growth.

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.


2011 ◽  
Vol 56 (3) ◽  
pp. 1546-1553 ◽  
Author(s):  
Jean-Pierre Veder ◽  
Ayman Nafady ◽  
Graeme Clarke ◽  
Ross P. Williams ◽  
Roland De Marco ◽  
...  

2018 ◽  
Vol 24 (47) ◽  
Author(s):  
María Escudero-Escribano ◽  
Anders F. Pedersen ◽  
Elisabeth T. Ulrikkeholm ◽  
Kim D. Jensen ◽  
Martin H. Hansen ◽  
...  

1988 ◽  
Vol 193 (1-2) ◽  
pp. L29-L36 ◽  
Author(s):  
Mahesh G. Samant ◽  
Michael F. Toney ◽  
Gary L. Borges ◽  
Lesser Blum ◽  
Owen R. Melroy

1990 ◽  
Author(s):  
R. Pinchaux ◽  
M. Sauvage-Simkin ◽  
J. Massies ◽  
N. Jedrecy ◽  
N. Greiser ◽  
...  

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