A Combined In Situ Grazing Incidence Small Angle X-Ray Scattering and Grazing Incidence X-Ray Diffraction Study of the Growth of Ge Islands on Pit-Patterned Si(001) Substrates
2011 ◽
Vol 11
(10)
◽
pp. 9123-9128
◽
Keyword(s):
X Ray
◽