In situ Characterization Of MBE Grown Surfaces And Interfaces By Grazing Incidence X-Ray Diffraction

1990 ◽  
Author(s):  
R. Pinchaux ◽  
M. Sauvage-Simkin ◽  
J. Massies ◽  
N. Jedrecy ◽  
N. Greiser ◽  
...  
2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.


Soft Matter ◽  
2019 ◽  
Vol 15 (4) ◽  
pp. 734-743 ◽  
Author(s):  
Pinzhang Chen ◽  
Jingyun Zhao ◽  
Yuanfei Lin ◽  
Jiarui Chang ◽  
Lingpu Meng ◽  
...  

The structural evolution of NR during stretching at −40 °C and in the strain–temperature space.


2011 ◽  
Vol 56 (3) ◽  
pp. 1546-1553 ◽  
Author(s):  
Jean-Pierre Veder ◽  
Ayman Nafady ◽  
Graeme Clarke ◽  
Ross P. Williams ◽  
Roland De Marco ◽  
...  

1990 ◽  
Vol 101 (1-4) ◽  
pp. 42-47 ◽  
Author(s):  
D.W. Kisker ◽  
P.H. Fuoss ◽  
S. Brennan ◽  
G. Renaud ◽  
K.L. Tokuda ◽  
...  

2009 ◽  
Vol 145 (3-4) ◽  
pp. 188-194 ◽  
Author(s):  
José A. Rodriguez ◽  
Jonathan C. Hanson ◽  
Wen Wen ◽  
Xianqin Wang ◽  
Joaquín L. Brito ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document