In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction—A powerful new technique for the characterization of electrochemical surfaces and interfaces

2006 ◽  
Vol 51 (26) ◽  
pp. 5920-5925 ◽  
Author(s):  
Roland De Marco ◽  
Zhong-Tao Jiang ◽  
Jay Martizano ◽  
Alex Lowe ◽  
Bobby Pejcic ◽  
...  
Keyword(s):  
Electrochemical Impedance Spectroscopy ◽  
Synchrotron Radiation ◽  
Impedance Spectroscopy ◽  
Electrochemical Impedance ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surfaces And Interfaces

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

In situ Characterization Of MBE Grown Surfaces And Interfaces By Grazing Incidence X-Ray Diffraction

1990 ◽  
Author(s):  
R. Pinchaux ◽  
M. Sauvage-Simkin ◽  
J. Massies ◽  
N. Jedrecy ◽  
N. Greiser ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
In Situ Characterization ◽  
X Ray ◽  
Surfaces And Interfaces
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