Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

Ben McLean; Hua Li; Ryan Stefanovic; Ross J. Wood; Grant B. Webber; Kazuhide Ueno; Masayoshi Watanabe; Gregory G. Warr; Alister Page; Rob Atkin

doi:10.1039/c4cp04522j

Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

Physical Chemistry Chemical Physics ◽

10.1039/c4cp04522j ◽

2015 ◽

Vol 17 (1) ◽

pp. 325-333 ◽

Cited By ~ 47

Author(s):

Ben McLean ◽

Hua Li ◽

Ryan Stefanovic ◽

Ross J. Wood ◽

Grant B. Webber ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Ionic Liquids ◽

Double Layer ◽

Pyrolytic Graphite ◽

Force Measurements ◽

Force Microscopy ◽

Electrode Surfaces ◽

Atomic Force ◽

Highly Ordered Pyrolytic Graphite

Atomic force microscopy (AFM) force measurements have been used to study the solvate ionic liquid (IL) double layer nanostructure at highly ordered pyrolytic graphite (HOPG) and Au(111) electrode surfaces as a function of potential.

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Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

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Size-Dependent Intercalation of Ions into Highly Oriented Pyrolytic Graphite in Ionic Liquids: An Electrochemical Atomic Force Microscopy Study

The Journal of Physical Chemistry C ◽

10.1021/jp203833v ◽

2011 ◽

Vol 115 (35) ◽

pp. 17429-17439 ◽

Cited By ~ 10

Author(s):

Pankaj R. Singh ◽

Xiangqun Zeng

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquids ◽

Pyrolytic Graphite ◽

Microscopy Study ◽

Highly Oriented Pyrolytic Graphite ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Size Dependent ◽

Atomic Force

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Potential dependent structure of electric double layer faced to solid electrode surfaces analyzed by electrochemical frequency modulation atomic force microscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.56.08la03 ◽

2017 ◽

Vol 56 (8S1) ◽

pp. 08LA03 ◽

Cited By ~ 2

Author(s):

Ken-ichi Fukui ◽

Toru Utsunomiya ◽

Yasuyuki Yokota

Keyword(s):

Atomic Force Microscopy ◽

Double Layer ◽

Frequency Modulation ◽

Electric Double Layer ◽

Solid Electrode ◽

Force Microscopy ◽

Electrode Surfaces ◽

Atomic Force

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Double Layer Structure of Ionic Liquids at the Au(111) Electrode Interface: An Atomic Force Microscopy Investigation

The Journal of Physical Chemistry C ◽

10.1021/jp200544b ◽

2011 ◽

Vol 115 (14) ◽

pp. 6855-6863 ◽

Cited By ~ 254

Author(s):

Robert Hayes ◽

Natalia Borisenko ◽

Matthew K. Tam ◽

Patrick C. Howlett ◽

Frank Endres ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquids ◽

Double Layer ◽

Layer Structure ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Double Layer Structure ◽

Microscopy Investigation ◽

Electrode Interface

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Quantifying the flux and spatial distribution of atomic hydrogen generated by a thermal source using atomic force microscopy to measure the chemical erosion of highly ordered pyrolytic graphite

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.2731351 ◽

2007 ◽

Vol 25 (3) ◽

pp. 621-625 ◽

Cited By ~ 6

Author(s):

Joshua D. Wnuk ◽

Justin M. Gorham ◽

Billy A. Smith ◽

Mi Shin ◽

D. Howard Fairbrother

Keyword(s):

Atomic Force Microscopy ◽

Spatial Distribution ◽

Atomic Hydrogen ◽

Pyrolytic Graphite ◽

Thermal Source ◽

Chemical Erosion ◽

Force Microscopy ◽

Atomic Force ◽

Highly Ordered Pyrolytic Graphite

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Electrochemistry of Highly Ordered Pyrolytic Graphite Surface Film Formation Observed by Atomic Force Microscopy

Journal of The Electrochemical Society ◽

10.1149/1.1838160 ◽

1997 ◽

Vol 144 (12) ◽

pp. 4161-4169 ◽

Cited By ~ 53

Author(s):

Andrew C. Chu ◽

Jack Y. Josefowicz ◽

Gregory C. Farrington

Keyword(s):

Atomic Force Microscopy ◽

Film Formation ◽

Surface Film ◽

Pyrolytic Graphite ◽

Graphite Surface ◽

Force Microscopy ◽

Atomic Force ◽

Highly Ordered Pyrolytic Graphite

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Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study

Surface and Interface Analysis ◽

10.1002/sia.3222 ◽

2010 ◽

Vol 42 (6-7) ◽

pp. 869-873 ◽

Cited By ~ 5

Author(s):

I. Preda ◽

L. Soriano ◽

L. Alvarez ◽

J. Méndez ◽

F. Yubero ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Comparative Study ◽

Pyrolytic Graphite ◽

Force Microscopy ◽

Atomic Force ◽

Highly Ordered Pyrolytic Graphite

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Scanning Tunneling and Atomic Force Microscopy Evidence for Covalent and Noncovalent Interactions between Aryl Films and Highly Ordered Pyrolytic Graphite

The Journal of Physical Chemistry C ◽

10.1021/jp411826s ◽

2014 ◽

Vol 118 (11) ◽

pp. 5820-5826 ◽

Cited By ~ 25

Author(s):

Haifeng Ma ◽

Lita Lee ◽

Paula A. Brooksby ◽

Simon A. Brown ◽

Sara J. Fraser ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Noncovalent Interactions ◽

Pyrolytic Graphite ◽

Scanning Tunneling ◽

Force Microscopy ◽

Atomic Force ◽

Highly Ordered Pyrolytic Graphite

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The Electric Double Layer in an Ionic Liquid Incorporated with Water Molecules: Atomic Force Microscopy Force Curve Study

ChemElectroChem ◽

10.1002/celc.201600177 ◽

2016 ◽

Vol 3 (12) ◽

pp. 2221-2226 ◽

Cited By ~ 27

Author(s):

Yunxin Zhong ◽

Jiawei Yan ◽

Miangang Li ◽

Li Chen ◽

Bingwei Mao

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Double Layer ◽

Electric Double Layer ◽

Water Molecules ◽

Force Curve ◽

Force Microscopy ◽

Atomic Force

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Effect of water on the electroresponsive structuring and friction in dilute and concentrated ionic liquid lubricant mixtures

Physical Chemistry Chemical Physics ◽

10.1039/d0cp05110a ◽

2020 ◽

Vol 22 (48) ◽

pp. 28191-28201

Author(s):

Georgia A. Pilkington ◽

Rebecca Welbourn ◽

Anna Oleshkevych ◽

Seiya Watanabe ◽

Patricia Pedraz ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Neutron Reflectivity ◽

Force Microscopy ◽

Liquid Lubricant ◽

Effect Of Water ◽

Atomic Force ◽

Ambient Levels

The influence of ambient levels of water on the electroresponsive interfacial structuring and nanofriction of ionic liquid lubricant mixtures has been investigated by neutron reflectivity and atomic force microscopy.

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