The Electric Double Layer in an Ionic Liquid Incorporated with Water Molecules: Atomic Force Microscopy Force Curve Study

2016 ◽  
Vol 3 (12) ◽  
pp. 2221-2226 ◽  
Author(s):  
Yunxin Zhong ◽  
Jiawei Yan ◽  
Miangang Li ◽  
Li Chen ◽  
Bingwei Mao
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Double Layer ◽  
Electric Double Layer ◽  
Water Molecules ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force

Improved atomic force microscopy resolution using an electric double layer

1997 ◽  
Vol 70 (7) ◽  
pp. 844-846 ◽  
Author(s):  
I. Yu. Sokolov ◽  
G. S. Henderson ◽  
F. J. Wicks ◽  
G. A. Ozin
Keyword(s):  
Atomic Force Microscopy ◽  
Double Layer ◽  
Electric Double Layer ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

2015 ◽  
Vol 17 (1) ◽  
pp. 325-333 ◽  
Author(s):  
Ben McLean ◽  
Hua Li ◽  
Ryan Stefanovic ◽  
Ross J. Wood ◽  
Grant B. Webber ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Ionic Liquids ◽  
Double Layer ◽  
Pyrolytic Graphite ◽  
Force Measurements ◽  
Force Microscopy ◽  
Electrode Surfaces ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

Atomic force microscopy (AFM) force measurements have been used to study the solvate ionic liquid (IL) double layer nanostructure at highly ordered pyrolytic graphite (HOPG) and Au(111) electrode surfaces as a function of potential.

scholarly journals A relationship between the force curve measured by atomic force microscopy in an ionic liquid and its density distribution on a substrate

2017 ◽  
Vol 19 (45) ◽  
pp. 30504-30512 ◽  
Author(s):  
Ken-ichi Amano ◽  
Yasuyuki Yokota ◽  
Takashi Ichii ◽  
Norio Yoshida ◽  
Naoya Nishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Density Distribution ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solvation Structure ◽  
Measured Force

A relationship between the force curve measured in an ionic liquid and the solvation structure is studied. Applying the obtained relationship, candidates of the solvation structure are estimated from a measured force curve.

scholarly journals Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Jennifer M. Black ◽  
Mengyang Zhu ◽  
Pengfei Zhang ◽  
Raymond R. Unocic ◽  
Daqiang Guo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Double Layer ◽  
Electric Double Layer ◽  
Distance Measurements ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Effect of water on the electroresponsive structuring and friction in dilute and concentrated ionic liquid lubricant mixtures

2020 ◽  
Vol 22 (48) ◽  
pp. 28191-28201
Author(s):  
Georgia A. Pilkington ◽  
Rebecca Welbourn ◽  
Anna Oleshkevych ◽  
Seiya Watanabe ◽  
Patricia Pedraz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Neutron Reflectivity ◽  
Force Microscopy ◽  
Liquid Lubricant ◽  
Effect Of Water ◽  
Atomic Force ◽  
Ambient Levels

The influence of ambient levels of water on the electroresponsive interfacial structuring and nanofriction of ionic liquid lubricant mixtures has been investigated by neutron reflectivity and atomic force microscopy.

Comparison of atomic force microscopy force curve and solvation structure studied by integral equation theory

2021 ◽  
Vol 154 (16) ◽  
pp. 164702
Author(s):  
Kota Hashimoto ◽  
Ken-ichi Amano ◽  
Naoya Nishi ◽  
Hiroshi Onishi ◽  
Tetsuo Sakka
Keyword(s):  
Integral Equation ◽  
Atomic Force Microscopy ◽  
Integral Equation Theory ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solvation Structure

Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods

2021 ◽  
Author(s):  
Berkin Uluutku ◽  
Santiago D. Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Signal To Noise Ratio ◽  
Gaussian Model ◽  
Force Curve ◽  
Simple Method ◽  
Force Microscopy ◽  
Electromagnetic Interactions ◽  
Atomic Force ◽  
Mechanical Deformations ◽  
Specialized Hardware

Abstract Quantitative measurement of the probe-sample interaction forces as a function of distance and time during imaging has been at the forefront of atomic force microscopy (AFM) research. This type of information is extremely valuable for understanding the material response to a variety of stimuli and interactions, such as mechanical deformations that vary in magnitude and rate of application, chemical interactions, or electromagnetic interactions. A variety of methods for performing such measurements simultaneously with topographical imaging is available, including methods based on Fourier analysis. Within these methods, reconstruction of the tip-sample force curve generally requires measurement of a large number of harmonics of the probe oscillation, which presents challenges such as the need for specialized hardware, low signal-to-noise ratio, and the need for extensive user expertise. In this paper, we present a simple method to perform a Gaussian-model-based fit of the tip-sample force curve across the surface, simultaneously with imaging, which requires measurement of only the first two or three harmonics for elastic materials. While such an approach only offers an approximate representation of the force curve, it can be highly accurate and fast, and has low instrumentation requirements, such that it can be relatively simple to implement on most commercial AFM setups.

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