Quantifying the flux and spatial distribution of atomic hydrogen generated by a thermal source using atomic force microscopy to measure the chemical erosion of highly ordered pyrolytic graphite

2007 ◽  
Vol 25 (3) ◽  
pp. 621-625 ◽  
Author(s):  
Joshua D. Wnuk ◽  
Justin M. Gorham ◽  
Billy A. Smith ◽  
Mi Shin ◽  
D. Howard Fairbrother
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Distribution ◽  
Atomic Hydrogen ◽  
Pyrolytic Graphite ◽  
Thermal Source ◽  
Chemical Erosion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

scholarly journals Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

2015 ◽  
Vol 17 (1) ◽  
pp. 325-333 ◽  
Author(s):  
Ben McLean ◽  
Hua Li ◽  
Ryan Stefanovic ◽  
Ross J. Wood ◽  
Grant B. Webber ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Ionic Liquids ◽  
Double Layer ◽  
Pyrolytic Graphite ◽  
Force Measurements ◽  
Force Microscopy ◽  
Electrode Surfaces ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

Atomic force microscopy (AFM) force measurements have been used to study the solvate ionic liquid (IL) double layer nanostructure at highly ordered pyrolytic graphite (HOPG) and Au(111) electrode surfaces as a function of potential.

Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Pyrolytic Graphite ◽  
Film Surface ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Investigation

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

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