Scanning Tunneling and Atomic Force Microscopy Evidence for Covalent and Noncovalent Interactions between Aryl Films and Highly Ordered Pyrolytic Graphite

2014 ◽  
Vol 118 (11) ◽  
pp. 5820-5826 ◽  
Author(s):  
Haifeng Ma ◽  
Lita Lee ◽  
Paula A. Brooksby ◽  
Simon A. Brown ◽  
Sara J. Fraser ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Noncovalent Interactions ◽  
Pyrolytic Graphite ◽  
Scanning Tunneling ◽  
Force Microscopy ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Pyrolytic Graphite ◽  
Film Surface ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Investigation

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

scholarly journals Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

2015 ◽  
Vol 17 (1) ◽  
pp. 325-333 ◽  
Author(s):  
Ben McLean ◽  
Hua Li ◽  
Ryan Stefanovic ◽  
Ross J. Wood ◽  
Grant B. Webber ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Ionic Liquids ◽  
Double Layer ◽  
Pyrolytic Graphite ◽  
Force Measurements ◽  
Force Microscopy ◽  
Electrode Surfaces ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

Atomic force microscopy (AFM) force measurements have been used to study the solvate ionic liquid (IL) double layer nanostructure at highly ordered pyrolytic graphite (HOPG) and Au(111) electrode surfaces as a function of potential.

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

scholarly journals Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

2015 ◽  
Vol 1 (1) ◽  
pp. 15-23 ◽  
Author(s):  
Natalia A. Lashkova ◽  
Nikita V. Permiakov ◽  
Alexander I. Maximov ◽  
Yulia M. Spivak ◽  
Vyacheslav A. Moshnikov
Keyword(s):  
Atomic Force Microscopy ◽  
Local Analysis ◽  
Scanning Tunneling ◽  
Force Microscopy ◽  
Atomic Force
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