Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study

2010 ◽  
Vol 42 (6-7) ◽  
pp. 869-873 ◽  
Author(s):  
I. Preda ◽  
L. Soriano ◽  
L. Alvarez ◽  
J. Méndez ◽  
F. Yubero ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Pyrolytic Graphite ◽  
Force Microscopy ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

scholarly journals Nanostructure of [Li(G4)] TFSI and [Li(G4)] NO3solvate ionic liquids at HOPG and Au(111) electrode interfaces as a function of potential

2015 ◽  
Vol 17 (1) ◽  
pp. 325-333 ◽  
Author(s):  
Ben McLean ◽  
Hua Li ◽  
Ryan Stefanovic ◽  
Ross J. Wood ◽  
Grant B. Webber ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Ionic Liquids ◽  
Double Layer ◽  
Pyrolytic Graphite ◽  
Force Measurements ◽  
Force Microscopy ◽  
Electrode Surfaces ◽  
Atomic Force ◽  
Highly Ordered Pyrolytic Graphite

Atomic force microscopy (AFM) force measurements have been used to study the solvate ionic liquid (IL) double layer nanostructure at highly ordered pyrolytic graphite (HOPG) and Au(111) electrode surfaces as a function of potential.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Atomistic comparative study of VUV photodeposited silicon nitride on InP(100) by simulation and atomic force microscopy

2000 ◽  
Vol 154-155 ◽  
pp. 337-344 ◽  
Author(s):  
J. Flicstein ◽  
E. Guillonneau ◽  
J. Marquez ◽  
L.S. How Kee Chun ◽  
D. Maisonneuve ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Nitride ◽  
Comparative Study ◽  
Force Microscopy ◽  
Atomic Force
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