scholarly journals Structure–function relations in diF-TES-ADT blend organic field effect transistors studied by scanning probe microscopy

2014 ◽  
Vol 2 (2) ◽  
pp. 245-255 ◽  
Author(s):  
Aaron B. Naden ◽  
Joachim Loos ◽  
Donald A. MacLaren
Keyword(s):  
Structure Function ◽  
Scanning Probe Microscopy ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Scanning Probe ◽  
Organic Field Effect Transistors ◽  
Probe Microscopy

Scanning probe microscopy and potentiometry using a junction field effect transistor based sensor

2018 ◽  
Vol 113 (22) ◽  
pp. 223101
Author(s):  
Paul Graf ◽  
Meike Flebbe ◽  
Stephanie Hoepken ◽  
Detlef Utzat ◽  
Hermann Nienhaus ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Effect Transistor

scholarly journals Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress

2007 ◽  
Vol 90 (19) ◽  
pp. 192104 ◽  
Author(s):  
S. G. J. Mathijssen ◽  
M. Cölle ◽  
A. J. G. Mank ◽  
M. Kemerink ◽  
P. A. Bobbert ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Gate Bias ◽  
Organic Field Effect Transistors ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Bias Stress ◽  
Scanning Kelvin Probe ◽  
Gate Bias Stress

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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