Scanning probe microscopy study of electronic properties in alkyl-substituted oligothiophene-based field-effect transitors

Vacuum ◽

10.1016/j.vacuum.2012.09.014 ◽

2013 ◽

Vol 90 ◽

pp. 17-24 ◽

Cited By ~ 3

Author(s):

N. Afsharimani ◽

B. Nysten

Keyword(s):

Electronic Properties ◽

Scanning Probe Microscopy ◽

Field Effect ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy

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Scanning Probe Microscopy Study of Electronic Properties in Alkyl-substituted Oligothiopene-based Field-Effect Transitors

Physics Procedia ◽

10.1016/j.phpro.2012.03.617 ◽

2012 ◽

Vol 32 ◽

pp. 669-679 ◽

Cited By ~ 2

Author(s):

N. Afsharimani ◽

B. Nysten

Keyword(s):

Electronic Properties ◽

Scanning Probe Microscopy ◽

Field Effect ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy

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Self-Organization and Nanoscale Electronic Properties of Azatriphenylene-Based Architectures: A Scanning Probe Microscopy Study

Advanced Materials ◽

10.1002/adma.200601437 ◽

2006 ◽

Vol 18 (24) ◽

pp. 3313-3317 ◽

Cited By ~ 45

Author(s):

M. Palma ◽

J. Levin ◽

V. Lemaur ◽

A. Liscio ◽

V. Palermo ◽

...

Keyword(s):

Electronic Properties ◽

Scanning Probe Microscopy ◽

Microscopy Study ◽

Scanning Probe ◽

Self Organization ◽

Probe Microscopy

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Combined scanning probe microscopy and electron microscopy study of microstructure evolution in copper processed by equal channel angular pressing

Zeitschrift für Metallkunde ◽

10.3139/146.030938 ◽

2003 ◽

Vol 94 (8) ◽

pp. 938-942 ◽

Cited By ~ 2

Author(s):

Eugen Rabkin ◽

David Gorni ◽

Itamar Gutman ◽

Eli Buchman ◽

Michael Kazakevich

Keyword(s):

Electron Microscopy ◽

Equal Channel Angular Pressing ◽

Microstructure Evolution ◽

Scanning Probe Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy ◽

Angular Pressing

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Understanding and Controlling the Electronic Properties of Graphene Using Scanning Probe Microscopy

10.21236/ada612223 ◽

2014 ◽

Author(s):

Brian LeRoy

Keyword(s):

Electronic Properties ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Conductive paths through polycrystalline BaTiO3: Scanning probe microscopy study

Applied Physics Letters ◽

10.1063/1.4961443 ◽

2016 ◽

Vol 109 (7) ◽

pp. 072904 ◽

Cited By ~ 7

Author(s):

Talin Ayvazian ◽

Gennadi Bersuker ◽

Zachary R. Lingley ◽

Miles J. Brodie ◽

Brendan J. Foran

Keyword(s):

Scanning Probe Microscopy ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy

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Scanning probe microscopy study of the molecular arrangement of CuPc crystal on Si(001)-(2 × 1)-H

Surface Science ◽

10.1016/s0039-6028(96)01364-7 ◽

1997 ◽

Vol 377-379 ◽

pp. 85-89 ◽

Cited By ~ 5

Author(s):

Masakazu Nakamura ◽

Hiroshi Tokumoto

Keyword(s):

Scanning Probe Microscopy ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy ◽

Molecular Arrangement

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Growth of cationic lipid toward bilayer lipid membrane by solution spreading: scanning probe microscopy study

Chemistry and Physics of Lipids ◽

10.1016/s0009-3084(02)00195-0 ◽

2003 ◽

Vol 123 (2) ◽

pp. 177-185 ◽

Cited By ~ 16

Author(s):

Li Wang ◽

Yonghai Song ◽

Xiaojun Han ◽

Bailin Zhang ◽

Erkang Wang

Keyword(s):

Scanning Probe Microscopy ◽

Lipid Membrane ◽

Cationic Lipid ◽

Bilayer Lipid Membrane ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy ◽

Bilayer Lipid

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ChemInform Abstract: Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM2Te2 (M: Co, Ni).

ChemInform ◽

10.1002/chin.199909008 ◽

2010 ◽

Vol 30 (9) ◽

pp. no-no

Author(s):

Wolfgang Tremel ◽

ET AL. ET AL.

Keyword(s):

Scanning Probe Microscopy ◽

Microscopy Study ◽

Scanning Probe ◽

Layered Chalcogenides ◽

Probe Microscopy

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A Scanning Probe Microscopy Study of Cd1−x Zn x Te

Journal of Electronic Materials ◽

10.1007/s11664-009-0693-7 ◽

2009 ◽

Vol 38 (8) ◽

pp. 1528-1532 ◽

Cited By ~ 5

Author(s):

C. K. Egan ◽

P. Dabrowski ◽

Z. Klusek ◽

A. W. Brinkman

Keyword(s):

Scanning Probe Microscopy ◽

Microscopy Study ◽

Scanning Probe ◽

Probe Microscopy

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Latex Film Morphology and Electrical Potential Pattern Dependence on Serum Components: A Scanning Probe Microscopy Study

Journal of Colloid and Interface Science ◽

10.1006/jcis.2002.8640 ◽

2002 ◽

Vol 255 (1) ◽

pp. 107-114 ◽

Cited By ~ 10

Author(s):

Amauri José Keslarek ◽

Carlos Alberto Rodrigues Costa ◽

Fernando Galembeck

Keyword(s):

Scanning Probe Microscopy ◽

Electrical Potential ◽

Microscopy Study ◽

Scanning Probe ◽

Latex Film ◽

Film Morphology ◽

Probe Microscopy ◽

Serum Components

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