Study of the Surface Adhesion of Pressure-Sensitive Adhesives by Atomic Force Microscopy and Spherical Indenter Tests

2000 ◽  
Vol 33 (5) ◽  
pp. 1878-1881 ◽  
Author(s):  
Adriana Paiva ◽  
Nina Sheller ◽  
Mark D. Foster ◽  
Alfred J. Crosby ◽  
Kenneth R. Shull
Keyword(s):  
Atomic Force Microscopy ◽  
Spherical Indenter ◽  
Surface Adhesion ◽  
Force Microscopy ◽  
Pressure Sensitive Adhesives ◽  
Pressure Sensitive ◽  
Atomic Force

Probing Surface Adhesion Forces ofEnterococcusfaecalisto Medical-Grade Polymers Using Atomic Force Microscopy

Langmuir ◽  
2004 ◽  
Vol 20 (10) ◽  
pp. 4172-4177 ◽  
Author(s):  
Annie Sénéchal ◽  
Shawn D. Carrigan ◽  
Maryam Tabrizian
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Surface Adhesion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Medical Grade

Effect of ion fluence on the surface morphology of single crystal magnesium oxide implanted with xenon

1995 ◽  
Vol 10 (11) ◽  
pp. 2823-2828 ◽  
Author(s):  
Wenbiao Jiang ◽  
M. Grant Norton ◽  
David B. Poker
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystal ◽  
Magnesium Oxide ◽  
Dislocation Loop ◽  
Spherical Indenter ◽  
Surface Roughening ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oriented Single Crystal

The surface morphology (001)-oriented single-crystal magnesium oxide (MgO) implanted with xenon ions has been examined using atomic force microscopy. It was found that at the lowest fluence used in this study (1.0 × 1014/cm2), a slight roughening of the (001) surface occurred. The magnitude of this roughening remained fairly constant with increases in fluence in the range 1.0 × 1014/cm2 to 3.0 × 1016/cm2. Implantation at fluences of ≥ 1.0 × 1017/cm2 caused significant surface roughening with the concomitant formation of micron-sized blisters. The appearance of some of these blisters resembles the rosette pattern that is also observed when the cleaved surfaces of MgO crystals are etched following indentation using a spherical indenter. This observation suggests that these blisters are formed by the growth of xenon inclusions, during implantation, by a dislocation loop punching mechanism.

New Approach to the Study of Particle–Surface Adhesion Using Atomic Force Microscopy

2000 ◽  
Vol 226 (1) ◽  
pp. 185-188 ◽  
Author(s):  
Gerold A. Willing ◽  
Taleb H. Ibrahim ◽  
Frank M. Etzler ◽  
Ronald D. Neuman
Keyword(s):  
Atomic Force Microscopy ◽  
Particle Surface ◽  
Surface Adhesion ◽  
New Approach ◽  
Force Microscopy ◽  
Atomic Force

Surface adhesion properties of graphene and graphene oxide studied by colloid-probe atomic force microscopy

2011 ◽  
Vol 258 (3) ◽  
pp. 1077-1081 ◽  
Author(s):  
Yan-Huai Ding ◽  
Ping Zhang ◽  
Hu-Ming Ren ◽  
Qin Zhuo ◽  
Zhong-Mei Yang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Surface Adhesion ◽  
Adhesion Properties ◽  
Force Microscopy ◽  
Atomic Force
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