New Approach to the Study of Particle–Surface Adhesion Using Atomic Force Microscopy

2000 ◽  
Vol 226 (1) ◽  
pp. 185-188 ◽  
Author(s):  
Gerold A. Willing ◽  
Taleb H. Ibrahim ◽  
Frank M. Etzler ◽  
Ronald D. Neuman
Keyword(s):  
Atomic Force Microscopy ◽  
Particle Surface ◽  
Surface Adhesion ◽  
New Approach ◽  
Force Microscopy ◽  
Atomic Force

Visualization of molecular binding sites at the nanoscale in the lift-up mode by amplitude-modulation atomic force microscopy

Nanoscale ◽  
2021 ◽  
Vol 13 (7) ◽  
pp. 4213-4220
Author(s):  
Tatsuhiro Maekawa ◽  
Takashi Nyu ◽  
Evan Angelo Quimada Mondarte ◽  
Hiroyuki Tahara ◽  
Kasinan Suthiwanich ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Recognition ◽  
Amplitude Modulation ◽  
Binding Sites ◽  
Local Distribution ◽  
New Approach ◽  
Molecular Binding ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Sites

We report a new approach to visualize the local distribution of molecular recognition sites with nanoscale resolution by amplitude-modulation atomic force microscopy.

scholarly journals A method for the direct measurement of surface tension of collected atmospherically relevant aerosol particles using atomic force microscopy

2016 ◽  
Vol 16 (15) ◽  
pp. 9761-9769 ◽  
Author(s):  
Andrew D. Hritz ◽  
Timothy M. Raymond ◽  
Dabrina D. Dutcher
Keyword(s):  
Surface Tension ◽  
Atomic Force Microscopy ◽  
Atmospheric Aerosol ◽  
Aerosol Particles ◽  
Particle Surface ◽  
Ex Situ ◽  
Force Microscopy ◽  
Atomic Force ◽  
Direct Measurements ◽  
Dry Conditions

Abstract. Accurate estimates of particle surface tension are required for models concerning atmospheric aerosol nucleation and activation. However, it is difficult to collect the volumes of atmospheric aerosol required by typical instruments that measure surface tension, such as goniometers or Wilhelmy plates. In this work, a method that measures, ex situ, the surface tension of collected liquid nanoparticles using atomic force microscopy is presented. A film of particles is collected via impaction and is probed using nanoneedle tips with the atomic force microscope. This micro-Wilhelmy method allows for direct measurements of the surface tension of small amounts of sample. This method was verified using liquids, whose surface tensions were known. Particles of ozone oxidized α-pinene, a well-characterized system, were then produced, collected, and analyzed using this method to demonstrate its applicability for liquid aerosol samples. It was determined that oxidized α-pinene particles formed in dry conditions have a surface tension similar to that of pure α-pinene, and oxidized α-pinene particles formed in more humid conditions have a surface tension that is significantly higher.

Interface between Adjacent UV-Treated or Detergent-Treated Vaccinia virus Particles

2005 ◽  
Vol 11 (S03) ◽  
pp. 86-89 ◽  
Author(s):  
A. V. Cardoso ◽  
G. S. Trindade
Keyword(s):  
Atomic Force Microscopy ◽  
Vaccinia Virus ◽  
Particle Surface ◽  
Surface Interactions ◽  
Surface Interaction ◽  
Force Microscopy ◽  
Virus Particles ◽  
Atomic Force ◽  
Analysis Of The Images ◽  
Viral Surface

While investigating isolated or agglomerates of treated Vaccinia virus intracellular mature (IMV) particles in atomic force microscopy (AFM) equipment we noticed that in some occasions the enveloped particles had been totally disrupted, with the interior being spread around. We have also observed in these samples what appear to be some rather intriguing viral surface interactions. Instead of showing a clear division between individual virions the particles seem to be continuous at the interfaces that show coalescence. In order to understand what was happening we focused our attention on the analysis of the images of the interface between virions particles, trying to find out what was the explanation for such type of particle surface interaction and in which conditions it would take place.

Study of the Surface Adhesion of Pressure-Sensitive Adhesives by Atomic Force Microscopy and Spherical Indenter Tests

2000 ◽  
Vol 33 (5) ◽  
pp. 1878-1881 ◽  
Author(s):  
Adriana Paiva ◽  
Nina Sheller ◽  
Mark D. Foster ◽  
Alfred J. Crosby ◽  
Kenneth R. Shull
Keyword(s):  
Atomic Force Microscopy ◽  
Spherical Indenter ◽  
Surface Adhesion ◽  
Force Microscopy ◽  
Pressure Sensitive Adhesives ◽  
Pressure Sensitive ◽  
Atomic Force

Cryo Atomic Force Microscopy: A New Approach for Biological Imaging at High Resolution

Biochemistry ◽  
1995 ◽  
Vol 34 (26) ◽  
pp. 8215-8220 ◽  
Author(s):  
Wenhai Han ◽  
Jianxun Mou ◽  
Jun Sheng ◽  
Jie Yang ◽  
Zhifeng Shao
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Biological Imaging ◽  
New Approach ◽  
Force Microscopy ◽  
Atomic Force
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