Surface adhesion properties of graphene and graphene oxide studied by colloid-probe atomic force microscopy

2011 ◽  
Vol 258 (3) ◽  
pp. 1077-1081 ◽  
Author(s):  
Yan-Huai Ding ◽  
Ping Zhang ◽  
Hu-Ming Ren ◽  
Qin Zhuo ◽  
Zhong-Mei Yang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Surface Adhesion ◽  
Adhesion Properties ◽  
Force Microscopy ◽  
Atomic Force

Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
X Ray Diffraction ◽  
Carbon Phase ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.

Graphene and graphene oxide nanogap electrodes fabricated by atomic force microscopy nanolithography

2010 ◽  
Vol 97 (13) ◽  
pp. 133301 ◽  
Author(s):  
Yudong He ◽  
Huanli Dong ◽  
Tao Li ◽  
Chengliang Wang ◽  
Wei Shao ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanogap Electrodes

scholarly journals Nanoscale mapping of dielectric properties based on surface adhesion force measurements

2018 ◽  
Vol 9 ◽  
pp. 900-906 ◽  
Author(s):  
Ying Wang ◽  
Yue Shen ◽  
Xingya Wang ◽  
Zhiwei Shen ◽  
Bin Li ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Dielectric Properties ◽  
Adhesion Force ◽  
Model Systems ◽  
Adhesion Forces ◽  
Surface Adhesion ◽  
Storage Devices ◽  
Force Microscopy ◽  
Atomic Force

The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.

scholarly journals A Turn-On Fluorescent Sensor for Hg2+ Based on Graphene Oxide

2017 ◽  
Vol 2017 ◽  
pp. 1-5 ◽  
Author(s):  
Yong Wu He ◽  
Yi Feng ◽  
Lian Wei Kang ◽  
Xiao Liang Li
Keyword(s):  
Heavy Metal ◽  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Heavy Metal Ions ◽  
Charge Transfer Complex ◽  
Fluorescent Sensor ◽  
Force Microscopy ◽  
Turn On ◽  
Atomic Force ◽  
Ft Ir

A graphene oxide- (GO-) boradiazaindacenes (BODIPY) charge-transfer complex (BGO) has been easily synthesized, and the structure of BGO was confirmed by FT-IR and atomic force microscopy (AFM). Moreover, the BGO was found that could be used as a turn-on fluorescent sensor for Hg2+. Upon addition of Hg2+, the fluorescence of BGO would be enhanced since the energy transfer between BODIPY and GO was inhibited. The selectivity and the competition performance of BGO towards Hg2+ were good among other heavy metal ions.

scholarly journals Measurements of the Electrical Conductivity of Monolayer Graphene Flakes Using Conductive Atomic Force Microscopy

Nanomaterials ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 2575
Author(s):  
Soomook Lim ◽  
Hyunsoo Park ◽  
Go Yamamoto ◽  
Changgu Lee ◽  
Ji Won Suk
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Monolayer Graphene ◽  
Synthesis Methods ◽  
Clear Understanding ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Graphene Flakes

The intrinsic electrical conductivity of graphene is one of the key factors affecting the electrical conductance of its assemblies, such as papers, films, powders, and composites. Here, the local electrical conductivity of the individual graphene flakes was investigated using conductive atomic force microscopy (C-AFM). An isolated graphene flake connected to a pre-fabricated electrode was scanned using an electrically biased tip, which generated a current map over the flake area. The current change as a function of the distance between the tip and the electrode was analyzed analytically to estimate the contact resistance as well as the local conductivity of the flake. This method was applied to characterize graphene materials obtained using two representative large-scale synthesis methods. Monolayer graphene flakes synthesized by chemical vapor deposition on copper exhibited an electrical conductivity of 1.46 ± 0.82 × 106 S/m. Reduced graphene oxide (rGO) flakes obtained by thermal annealing of graphene oxide at 300 and 600 °C exhibited electrical conductivities of 2.3 ± 1.0 and 14.6 ± 5.5 S/m, respectively, showing the effect of thermal reduction on the electrical conductivity of rGO flakes. This study demonstrates an alternative method to characterizing the intrinsic electrical conductivity of graphene-based materials, which affords a clear understanding of the local properties of individual graphene flakes.

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