Probing Surface Adhesion Forces ofEnterococcusfaecalisto Medical-Grade Polymers Using Atomic Force Microscopy

Langmuir ◽  
2004 ◽  
Vol 20 (10) ◽  
pp. 4172-4177 ◽  
Author(s):  
Annie Sénéchal ◽  
Shawn D. Carrigan ◽  
Maryam Tabrizian
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Surface Adhesion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Medical Grade

Nanoscale adhesion forces between the fungal pathogen Candida albicans and macrophages

2016 ◽  
Vol 1 (1) ◽  
pp. 69-74 ◽  
Author(s):  
Sofiane El-Kirat-Chatel ◽  
Yves F. Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Candida Albicans ◽  
Immune Cells ◽  
Fungal Pathogen ◽  
Fungal Pathogens ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

We establish atomic force microscopy as a new nanoscopy platform for quantifying the forces between fungal pathogens and immune cells.

scholarly journals A modular atomic force microscopy approach reveals a large range of hydrophobic adhesion forces among bacterial members of the leaf microbiota

2019 ◽  
Vol 13 (7) ◽  
pp. 1878-1882 ◽  
Author(s):  
Maximilian Mittelviefhaus ◽  
Daniel B. Müller ◽  
Tomaso Zambelli ◽  
Julia A. Vorholt
Keyword(s):  
Atomic Force Microscopy ◽  
Large Range ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

scholarly journals Nanoscale mapping of dielectric properties based on surface adhesion force measurements

2018 ◽  
Vol 9 ◽  
pp. 900-906 ◽  
Author(s):  
Ying Wang ◽  
Yue Shen ◽  
Xingya Wang ◽  
Zhiwei Shen ◽  
Bin Li ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Dielectric Properties ◽  
Adhesion Force ◽  
Model Systems ◽  
Adhesion Forces ◽  
Surface Adhesion ◽  
Storage Devices ◽  
Force Microscopy ◽  
Atomic Force

The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.

Adhesion Forces between LewisX Determinant Antigens as Measured by Atomic Force Microscopy

2001 ◽  
Vol 40 (16) ◽  
pp. 3052-3055 ◽  
Author(s):  
Christophe Tromas ◽  
Javier Rojo ◽  
Jesús M. de la Fuente ◽  
Africa G. Barrientos ◽  
Ricardo García ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic force microscopy of DNA and bacteriophage in air, water and propanol: the role of adhesion forces

1993 ◽  
Vol 21 (5) ◽  
pp. 1117-1123 ◽  
Author(s):  
Y.L. Lyubchenko ◽  
P.I. Oden ◽  
D. Lampner ◽  
S.M. Lindsay ◽  
K.A. Dunker
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Challenges of Working with Active Pharmaceutical Ingredients to Measure Adhesion Forces by Atomic Force Microscopy

2011 ◽  
Vol 17 (S2) ◽  
pp. 1128-1129
Author(s):  
A Vogt ◽  
J Reddel
Keyword(s):  
Atomic Force Microscopy ◽  
Active Pharmaceutical Ingredients ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Pharmaceutical Ingredients ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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