Time-of-Flight Secondary Ion Mass Spectroscopy Characterization of the Covalent Bonding between a Carbon Surface and Aryl Groups

Langmuir ◽  
2005 ◽  
Vol 21 (1) ◽  
pp. 280-286 ◽  
Author(s):  
Catherine Combellas ◽  
Frédéric Kanoufi ◽  
Jean Pinson ◽  
Fetah I. Podvorica
Keyword(s):  
Mass Spectroscopy ◽  
Time Of Flight ◽  
Covalent Bonding ◽  
Carbon Surface ◽  
Secondary Ion Mass Spectroscopy ◽  
Secondary Ion

An investigation of the wear track on DLC (a-C:H) film by time-of-flight secondary ion mass spectroscopy

2001 ◽  
Vol 146-147 ◽  
pp. 378-383 ◽  
Author(s):  
Haruyo Fukui ◽  
Miki Irie ◽  
Yoshiharu Utsumi ◽  
Kazuhiko Oda ◽  
Hisanori Ohara
Keyword(s):  
Mass Spectroscopy ◽  
Wear Track ◽  
Time Of Flight ◽  
Secondary Ion Mass Spectroscopy ◽  
Secondary Ion

Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy

2013 ◽  
Vol 15 (14) ◽  
pp. 5202 ◽  
Author(s):  
Robert J. Thompson ◽  
Sarah Fearn ◽  
Ke Jie Tan ◽  
Hans George Cramer ◽  
Christian L. Kloc ◽  
...  
Keyword(s):  
Single Crystal ◽  
Mass Spectroscopy ◽  
Time Of Flight ◽  
Surface Oxidation ◽  
Secondary Ion Mass Spectroscopy ◽  
Secondary Ion
Sign in / Sign up

Export Citation Format

Share Document