Studies of Ion-Selective Solvent Polymeric Membranes by X-ray Photoelectron Spectroscopy and Time-of-Flight Static Secondary Ion Mass Spectroscopy

1998 ◽  
Vol 70 (20) ◽  
pp. 4241-4246 ◽  
Author(s):  
Qingshan Ye ◽  
George Horvai ◽  
András Tóth ◽  
Imre Bertóti ◽  
Marc Botreau ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
Polymeric Membranes ◽  
Selective Solvent ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

scholarly journals Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 295-298 ◽  
Author(s):  
Wen Biao YING ◽  
Yusuke MIZOKAWA ◽  
Yoshitomo KAMIURA ◽  
Yong Bing YU ◽  
Masafumi NISHIMATSU ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Surfaces ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Doped Silicon ◽  
Phosphorus Doped ◽  
Secondary Ion
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