Quantitative Evaluation of SERS-Active Ag Film Nanostructure by Atomic Force Microscopy

1996 ◽  
Vol 68 (3) ◽  
pp. 473-480 ◽  
Author(s):  
Shane E. Roark ◽  
David J. Semin ◽  
Kathy L. Rowlen
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Evaluation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ag Film

scholarly journals Quantitative evaluation of atherosclerotic plaques using cross-polarization optical coherence tomography, nonlinear, and atomic force microscopy

2016 ◽  
Vol 21 (12) ◽  
pp. 126010 ◽  
Author(s):  
Ekaterina V. Gubarkova ◽  
Mikhail Yu. Kirillin ◽  
Varvara V. Dudenkova ◽  
Peter S. Timashev ◽  
Svetlana L. Kotova ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Coherence Tomography ◽  
Quantitative Evaluation ◽  
Atherosclerotic Plaques ◽  
Optical Coherence ◽  
Cross Polarization ◽  
Force Microscopy ◽  
Atomic Force

Quantitative evaluation of local permittivity of semiconductor nanomaterials using microwave atomic force microscopy

2021 ◽  
Vol 118 (19) ◽  
pp. 193103
Author(s):  
Minji Zhao ◽  
Bo Tong ◽  
Yasuhiro Kimura ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Evaluation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Semiconductor Nanomaterials

Effect of Thicknesses on the Optical and Electrical Properties of Ag Films on PET Substrates

2009 ◽  
Vol 79-82 ◽  
pp. 655-658 ◽  
Author(s):  
Jing Lv ◽  
Sheng Ni Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Critical Thickness ◽  
Thermal Evaporation ◽  
Optical And Electrical Properties ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Bulk Silver ◽  
Ag Film

A series of Ag films with different thicknesses were prepared on polyethylene terephthalate (PET) substrates under identical conditions by thermal evaporation. The effect of the thickness on the optical and electrical properties of the films was studied. The morphology of the samples was investigated by atomic force microscopy (AFM). The optical and electrical properties were measured by spectrophotometer and four-point probe method, respectively. The experimental results show that the reflectance increases, while transmittance and resistivity decrease with the increase of the thickness. There exists a critical thickness of the film and it is 75 nm in this experiment. The optical and electrical properties of Ag films on PET substrates with thickness larger than critical thickness, are close to those of the conventional bulk silver. The resistivity of the 150-nm film is 3.0±0.2 μΩ•cm, which is lower than that of the 250-nm Ag film grown on BK-7 glass substrates.

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